2015
DOI: 10.1002/pssc.201400306
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Characterization of CuInS2‐Cu2ZnSnS4 crystals grown from the melt

Abstract: Cu2(2.00‐x)((2In)y (ZnSn)(1.00‐y))x S4 crystals were grown from the melt. 23 samples with different x and y values were synthesized by heating constituent elementary Cu, In, S and Zn‐Sn alloy at 1,250 °C for 10 hours in each evacuated fused‐quartz ampule. All samples were characterized by powder X‐ray diffraction analysis. Two peaks are seen at the 112 diffraction positions in 0.3 ≤ y ≤ 0.9. The FWHM of the 112 diffraction peak broadened in 0.2 ≤ y ≤ 0.7. Lattice constants were obtained by Rietveld method usin… Show more

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Cited by 1 publication
(4 citation statements)
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“…Applying two‐curve Gaussian function, peaks at about 28.26(3)° were derived in the range of 0.32 ≤ x ≤ 0.66. This peak was also observed in our previous report . Actually, we found small shoulders at this position in patterns of x = 0.78 and 0.85, but they were too small to evaluate.…”
Section: Resultssupporting
confidence: 90%
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“…Applying two‐curve Gaussian function, peaks at about 28.26(3)° were derived in the range of 0.32 ≤ x ≤ 0.66. This peak was also observed in our previous report . Actually, we found small shoulders at this position in patterns of x = 0.78 and 0.85, but they were too small to evaluate.…”
Section: Resultssupporting
confidence: 90%
“…The Rietveld method was applied to derive the lattice constants. The Itrue4¯2d model and the Itrue4¯2m model were used for CuInS 2 phase and Cu 2 ZnSnS 4 phase, respectively . The models were used separately or simultaneously, to obtain suitable results.…”
Section: Methodsmentioning
confidence: 99%
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