2000
DOI: 10.1063/1.372423
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Characterization of deep impurities in semiconductors by terahertz tunneling ionization

Abstract: Tunneling ionization in high-frequency fields as well as in static fields is suggested as a method for the characterization of deep impurities in semiconductors. It is shown that an analysis of the field and temperature dependences of the ionization probability allows to obtain defect parameters like the charge of the impurity, tunneling times, the Huang-Rhys parameter, the difference between optical and thermal binding energy and the basic structure of the defect adiabatic potentials. Compared to static field… Show more

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Cited by 66 publications
(52 citation statements)
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“…The spatial beam distribution has an almost Gaussian profile which is measured by a pyroelectric camera. 36 Right (σ + ) and left (σ − ) handed circularly polarized light is obtained by a λ/4 plate. The experimental geometry is sketched in Fig.…”
Section: Methodsmentioning
confidence: 99%
“…The spatial beam distribution has an almost Gaussian profile which is measured by a pyroelectric camera. 36 Right (σ + ) and left (σ − ) handed circularly polarized light is obtained by a λ/4 plate. The experimental geometry is sketched in Fig.…”
Section: Methodsmentioning
confidence: 99%
“…Finally, we estimate the ratchet current magnitude for Si-MOSFETs following Eq. (24). The estimation of the current density j normalized by the laser radiation intensity I yields j/I ∼ 1 × 10 −9 A cm/W for the electron density N s = 3.8 × 10 12 cm −2 and effective field F = 1.4 × 10 5 V/cm (corresponding to the energy distance ε 21 = 35 meV at the gate voltage V g = 20 V, see Fig.…”
Section: Discussionmentioning
confidence: 99%
“…The radiation at normal incidence was focused in a spot of about 1 to 3 mm diameter. The spatial beam distribution had an almost Gaussian profile which was measured by a pyroelectric camera [24]. The experimental geometry is illustrated in the inset of Fig.…”
Section: Samples and Techniquementioning
confidence: 99%
“…The beam has an almost Gaussian form, which is measured by a pyroelectric camera. 38 All experiments are performed at normal incidence of light. Photocurrents are measured perpendicularly (J y ) and parallel (J x ) to the applied magnetic field (B x ), referred to as transverse and longitudinal photocurrents, respectively.…”
Section: Samples and Experimental Techniquesmentioning
confidence: 99%