Characterization of defects in flexible circuits with ultrasonic atomic force microscopy

Nalladega, Vijay; Sathish, Shamachary; Brar, Amarjit S.

doi:10.1016/j.microrel.2008.05.004

Cited by 5 publications

(3 citation statements)

References 18 publications

Supporting

Mentioning

Contrasting

Unclassified

Order By: Relevance

“…这种分类方法可将薄膜缺陷分为杂质缺陷、化学缺陷、电致缺陷 [11] 、力学键缺陷、热缺陷，结构缺陷等 [12] [13] 、超声波检测 [14] 、利用磁场来检测以及利用光学方法来检测等 [15][16][17] 。其中，利用光学方法进行缺陷检测主要是利用光的以下几个特性：光的散射 [18] 、光的干涉现象和光的偏振特性等。表 2 是上述各种光学方法优缺点的比较。综合光的椭圆偏振特性 [19]…”

Section: 从形成原因分unclassified

An Optical Characterization of Film Defect Based on the Classification

张¹

2011

View full text Add to dashboard Cite

Defects of the thin-film have very important implications for its optical, electrical, thermal and other physical properties, so that the defects investigation has great significance to the preparation of thin films, the film detection and characterization. By different angles, the crystal defects of thin film are classified. A defect detection method is presented, which uses a photoelectric detection technology combined with the computer to process the film microstructure and control film defects. According to this detection method, a new determination of optical constants can be used to characterize the crystal thin-film defects. Either the classification of film defects from structure, mechanics, energy, motion, thermodynamics and optics, or characterization of film defects, these considerations point of view the problems are not isolated, but interrelated. This work can be helpful to have a complete and systematic understanding of membrane defects.

show abstract

Section: 从形成原因分unclassified

An Optical Characterization of Film Defect Based on the Classification

张¹

2011

View full text Add to dashboard Cite

show abstract

“…Several new techniques based on AFM have been developed to measure material properties in the nanometer regime. One such technique is ultrasonic force microscopy (UFM), [15][16][17] which is capable of mapping local elastic variations in the material. UFM is based on detecting acoustic displacements of a sample placed on a transducer by an AFM probe.…”

Section: Introductionmentioning

confidence: 99%

“…It has been shown that UFM can be an effective tool in detecting cracks, subsurface cracks, and delaminations in materials. [16][17][18][19] This study focused on the characterization of fracture surfaces in fatigue-tested nickel alloys with a range of grain sizes in an effort to understand the key microstructural features controlling fatigue crack propagation in fine-grained structures. WLIM and the combination of AFM and UFM were used to characterize the fatigue-fractured surfaces of Ni-20 wt pct Cr alloys.…”

Section: Introductionmentioning

confidence: 99%

Characterization of Fatigue Fracture in Ni-20 Pct Cr Alloys Using White Light Interference Microscopy and Scanning Probe Microscopy

Nalladega

Sathish

Abburi

et al. 2010

Metall Mater Trans A

View full text Add to dashboard Cite

Nanostructured and ultra-fine-grained metals and alloys are becoming of engineering interest. However, little is known about the influence of grain refinement on fatigue crack behavior. In this study, fatigue crack growth behavior and the key microstructural features controlling the fatigue fracture in nanocrystalline and ultra-fine-grain nickel alloys, processed using different techniques, were investigated. White light interference microscopy as well as the combination of atomic force microscopy (AFM) and ultrasonic force microscopy (UFM) were used to characterize the fractured surfaces of the metals. The role of grain size on the fatigue crack growth resistance and the effect of fracture surface roughness on the crack growth rate were evaluated. The combination of AFM and UFM is presented as a complementary tool to scanning electron microscopy in the fractography of metals.

show abstract

Polymer Material Characterization by Acoustic Force Microscopy

Korach

2012

Acoustic Scanning Probe Microscopy

View full text Add to dashboard Cite

Characterization of defects in flexible circuits with ultrasonic atomic force microscopy

Cited by 5 publications

References 18 publications

An Optical Characterization of Film Defect Based on the Classification

An Optical Characterization of Film Defect Based on the Classification

Characterization of Fatigue Fracture in Ni-20 Pct Cr Alloys Using White Light Interference Microscopy and Scanning Probe Microscopy

Polymer Material Characterization by Acoustic Force Microscopy

Contact Info

Product

Resources

About