2022
DOI: 10.1016/j.solmat.2021.111468
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Characterization of front contact degradation in monocrystalline and multicrystalline silicon photovoltaic modules following damp heat exposure

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Cited by 27 publications
(14 citation statements)
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“…Other analysis majorly focuses on the impacts of the degradation on solar cells. Contact failures of front contacts [115], and soldered bonds are used as basis for lifetime prediction of PV modules [116]. Surface corrosion on solar cell level can become noticeable as snail tracks [117].…”
Section: Corrosive Loadsmentioning
confidence: 99%
“…Other analysis majorly focuses on the impacts of the degradation on solar cells. Contact failures of front contacts [115], and soldered bonds are used as basis for lifetime prediction of PV modules [116]. Surface corrosion on solar cell level can become noticeable as snail tracks [117].…”
Section: Corrosive Loadsmentioning
confidence: 99%
“…Although the raw EVA materials are generally enhanced with chemical additives in the manufacturing process, they suffer from thermo-photo-oxidative degradation with prolonged exposure to harsh working environments. [22][23][24][25] The typical degradation of polymer chains composing the encapsulant EVA layer involves the loss of small molecules, such as acetic acid and protons, and consequent failure at the macromolecular level. As a result, the macromolecular changes lead to the deterioration of optical properties of the EVA layers, such as browning-yellowing and snail trails.…”
Section: Introductionmentioning
confidence: 99%
“…Ethylene‐ co ‐vinyl acetate (EVA) is frequently used as the encapsulant material of PV modules due to its excellent physical characteristics and relatively low cost. Although the raw EVA materials are generally enhanced with chemical additives in the manufacturing process, they suffer from thermo‐photo‐oxidative degradation with prolonged exposure to harsh working environments 22–25 . The typical degradation of polymer chains composing the encapsulant EVA layer involves the loss of small molecules, such as acetic acid and protons, and consequent failure at the macromolecular level.…”
Section: Introductionmentioning
confidence: 99%
“…In addition to the traditionally reported module performance parameters (e.g., efficiency, J SC , V SC , FF ), other characteristics of the wafers and cells are extracted to decouple optical, recombination, and resistive losses. In particular, this work looks at how much of the power loss is due to changes in the aforementioned recombination losses versus other pertinent forms of degradation, like contact and interconnect degradation that can increase series resistance ( R normalS ) [ 40–46 ] or discoloration of the encapsulation materials that can lower J SC . [ 47–50 ]…”
Section: Introductionmentioning
confidence: 99%