2020
DOI: 10.1038/s41598-020-70395-2
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Characterization of gap-plasmon based metasurfaces using scanning differential heterodyne microscopy

Abstract: Optical phase-gradient metasurfaces, whose unique capabilities are based on the possibility to arbitrarily control the phase of reflected/transmitted light at the subwavelength scale, are seldom characterized with direct measurements of phase gradients. Using numerical simulations and experimental measurements, we exploit the technique of scanning differential heterodyne microscopy (SDHM) for direct phase and amplitude characterization of gap-plasmon based optical metasurfaces. Two metasurface configurations u… Show more

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Cited by 4 publications
(8 citation statements)
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“…The sample was fabricated using electron-beam lithography and lift-off technique, as described in detail in Ref. 37. Then the entire grating area 80×80 μm was covered with a dielectric film with a thickness td and refractive index nd (not shown in Fig.…”
Section: Plasmonic Metasurfacementioning
confidence: 99%
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“…The sample was fabricated using electron-beam lithography and lift-off technique, as described in detail in Ref. 37. Then the entire grating area 80×80 μm was covered with a dielectric film with a thickness td and refractive index nd (not shown in Fig.…”
Section: Plasmonic Metasurfacementioning
confidence: 99%
“…Recently, the study of phase objects based on plasmonic metasurfaces has become widespread, including for various applications in optical radiation control systems and elements, such as terahertz absorbers, nonlinear integrated optics, thermal emission control, and focusing elements 31 38 The question arises whether it is possible to use this promising technology to fabricate phase objects suitable for observing the superresolution effect in edge detection. The answer on this question is not obvious, since the characteristic size of the unit cell of the metasurface 35 37 is comparable with the wavelength of optical radiation and with the size of the focused probing spot of the microscope.…”
Section: Introductionmentioning
confidence: 99%
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“…Measuring the complex wavefront from recorded intensity images is demanded in various fields, including microscopy 1 , 2 , optical element characterization 3 , 4 and imaging through scattering media 5 , 6 . Due to the extremely high frequency of light, only the intensity is directly recorded by available sensors.…”
Section: Introductionmentioning
confidence: 99%