2012
DOI: 10.4028/www.scientific.net/ddf.331.113
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Characterization of H-Plasma Treated ZnO Crystals by Positron Annihilation and Atomic Force Microscopy

Abstract: Nominally undoped, hydrothermally grown ZnO single crystals have been investigated before and after exposure to remote H-plasma. Defect characterization has been made by two complementary techniques of positron annihilation: positron lifetime spectroscopy and coincidence Doppler broadening. The high-momentum parts of the annihilation photon momentum distribution have been calculated from first principles in order to assist in defect identification. The positron annihilation results are supplemented by Atomic F… Show more

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Cited by 5 publications
(2 citation statements)
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“…Correspondingly, the reduction of s 1 could be caused by thermally-activated mutual annihilation of intrinsic point defects. 16 This is a typical phenomenon of materials annealed at high temperature.…”
Section: Discussionmentioning
confidence: 96%
“…Correspondingly, the reduction of s 1 could be caused by thermally-activated mutual annihilation of intrinsic point defects. 16 This is a typical phenomenon of materials annealed at high temperature.…”
Section: Discussionmentioning
confidence: 96%
“…This value agrees well with the expected one of 770 eV, as shown in Fig.15.The results of cDB measurements are commonly presented in so-called ratio plots, where the momentum distribution of the electrons for different positron annihilation sites is referred to a reference sample, mostly to a sample without defects. A typical example for experimental and theoretical ratio curves and their discussion can be found in Ref 21…”
mentioning
confidence: 99%