Characterization of Intentional Contaminations at the HgCdTe Passivation Interface and Their Effects on Photodiode Performance

Bel, Steven; Lobre, Clément; Petit, Sarah; Veillerot, Marc; Badano, Giacomo

doi:10.1007/s11664-024-11137-2

J. Electron. Mater.

2024

DOI: 10.1007/s11664-024-11137-2

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Characterization of Intentional Contaminations at the HgCdTe Passivation Interface and Their Effects on Photodiode Performance

Steven Bel,

Clément Lobre,

Sarah Petit

et al.

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Characterization of Intentional Contaminations at the HgCdTe Passivation Interface and Their Effects on Photodiode Performance

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References 32 publications

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