2000
DOI: 10.1016/s0008-6223(99)00177-3
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Characterization of interfaces in C fiber-reinforced laminated C–SiC matrix composites

Abstract: Interfacial studies of carbon fiber-reinforced laminated matrix composites (LMCs) of alternating matrix layers of SiC and carbon prepared by forced-flow thermal-gradient chemical vapor infiltration (FCVI) have been undertaken by transmission electron microscopy (TEM). The carbon-carbon interfacial region consistently displayed distinctive features that enabled the microstructures of the fiber carbon, a thin carbon layer deposited as fiber coating, and the matrix carbon to be distinguished. A thin discontinuous… Show more

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Cited by 41 publications
(19 citation statements)
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“…4(a)), but it is interesting that no delamination is found between the first PyC layer and the second SiC layer, and between the third PyC layer and the fourth SiC layer. Such phenomenon could be explained by incorporating the TEM analytical results by Appiah [15] and Bertrand [26]. The intervening SiC layers grow onto the oriented PyC layers resulting in a smooth and strong interfaces of PyC 1 /SiC 2 and PyC 3 /SiC 4 , while the PyC layers deposit around the preexisting SiC layers made of large-faceted crystals leading to a rough and weak interface of SiC 2 /PyC 3 (the subscripts denote the sequence of the layers from inside to outside) [15,26].…”
Section: Microstructure Characterizationmentioning
confidence: 99%
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“…4(a)), but it is interesting that no delamination is found between the first PyC layer and the second SiC layer, and between the third PyC layer and the fourth SiC layer. Such phenomenon could be explained by incorporating the TEM analytical results by Appiah [15] and Bertrand [26]. The intervening SiC layers grow onto the oriented PyC layers resulting in a smooth and strong interfaces of PyC 1 /SiC 2 and PyC 3 /SiC 4 , while the PyC layers deposit around the preexisting SiC layers made of large-faceted crystals leading to a rough and weak interface of SiC 2 /PyC 3 (the subscripts denote the sequence of the layers from inside to outside) [15,26].…”
Section: Microstructure Characterizationmentioning
confidence: 99%
“…Such phenomenon could be explained by incorporating the TEM analytical results by Appiah [15] and Bertrand [26]. The intervening SiC layers grow onto the oriented PyC layers resulting in a smooth and strong interfaces of PyC 1 /SiC 2 and PyC 3 /SiC 4 , while the PyC layers deposit around the preexisting SiC layers made of large-faceted crystals leading to a rough and weak interface of SiC 2 /PyC 3 (the subscripts denote the sequence of the layers from inside to outside) [15,26]. Additionally, the mismatch of coefficient of thermal expansion (CTE) between the PyC and SiC (α SiC = 5 × 10 −6 /K, α C = 1 × 10 −6 /K [27]) causes matrix delamination during the cooling down stage of processing.…”
Section: Microstructure Characterizationmentioning
confidence: 99%
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“…The microstructural investigation was carried out using a JEOL-2010F transmission electron microscope (TEM). The preparation method of specimens for TEM observations followed the procedure described by Appiah et al [10].…”
Section: Introductionmentioning
confidence: 99%