2006
DOI: 10.1016/j.mechmat.2006.02.011
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Characterization of mechanical properties of thin films using nanoindentation test

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Cited by 73 publications
(34 citation statements)
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“…5 Depending upon the conjugate film with substrate, the effects of their mechanical properties tend to establish a critical ratio between maximum penetration depth (h max ) and film thickness (l), so that the substrate does not interfere in the assessment of film properties. [13][14] On the other hand, determining film thickness becomes difficult due to the need for specific instruments and costly, protracted tests, such as scanning electron microscopy (SEM) and Calowear testing, in addition to instrumented indentation testing. [15][16] Accordingly, the present study used the Finite Element Method (FEM) to simulate the indentation testing in a conjugate composed of Titanium Nitride (TiN) film deposited by plasma processing onto a tool Steel (M2).…”
Section: 12mentioning
confidence: 99%
“…5 Depending upon the conjugate film with substrate, the effects of their mechanical properties tend to establish a critical ratio between maximum penetration depth (h max ) and film thickness (l), so that the substrate does not interfere in the assessment of film properties. [13][14] On the other hand, determining film thickness becomes difficult due to the need for specific instruments and costly, protracted tests, such as scanning electron microscopy (SEM) and Calowear testing, in addition to instrumented indentation testing. [15][16] Accordingly, the present study used the Finite Element Method (FEM) to simulate the indentation testing in a conjugate composed of Titanium Nitride (TiN) film deposited by plasma processing onto a tool Steel (M2).…”
Section: 12mentioning
confidence: 99%
“…Such a combination of a keen wedge blade and a flexible underlay is supposed to be empirically used in several fields. Pelletie et al (9) has studied determining the mechanical properties of thin films on substrate with a rigid indenter loaded for a nano-indentation test. This report is useful for understanding the influence of the Young's modulus ratio and the yielding stress ratio of a worksheet with a substrate.…”
Section: Introductionmentioning
confidence: 99%
“…[1][2][3][4][5] Various methods have been proposed for determining the mechanical properties of thin film systems and observing their microstructural evolution. [6][7][8][9] Previous studies have reported that nanoindentation prompts a phase transformation within the indented zone, and therefore has a significant effect upon the load-displacement response of the film. 10,11) Furthermore, for thin films deposited on a silicon substrate, various forms of silicide phase are formed at the film/ substrate interface during substrate annealing.…”
Section: Introductionmentioning
confidence: 99%