Abstract:The shear force mechanism has been utilized as a distance regulation method in scanning probe microscopes. However, the origin of shear force is still unclear. One of the most important reasons for the shear-force damping is due to the presence of a water contamination layer at the sample surface in ambient conditions. Understanding the behavior of such mesoscopic fluid-like films is of significance for studies of not only scanning probe microscopy but also other complex surface phenomena, such as nanotribolog… Show more
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