“…Contrast measurements have been carried out on the MMA fabricated by Texas Instrument for projection displays, in order to simulate the actual MOEMS device for NIRSpec, and to establish the test procedure. 5 We can address several parameters with our modular characterization bench, as the size of the source, its location with respect to the micro-elements, the wavelength, and the input and output pupil size. Three groups of elements are considered (Fig.…”