Characterization Of Multilayer X-Ray Analyzers: Models And Measurements

Henke, Burton L.; Uejio, J. Y.; Yamada, Haruka; Tackaberry, Ron E.

doi:10.1117/12.7973933

Cited by 43 publications

(18 citation statements)

References 9 publications

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“…In this report we characterize these two crystal types using the three parameter model and investigate the important differences between them and those crystal types which can be fit using the two parameter model. 8 can be used for our present purposes.…”

Section: Ys = Tytymentioning

confidence: 99%

A refined model for characterizing x-ray multilayers

Oren¹,

Henke²

1987

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Section: Ys = Tytymentioning

confidence: 99%

A refined model for characterizing x-ray multilayers

Oren¹,

Henke²

1987

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“…For low absorbing, well ordered crystals (with significant multiple internal reflections) the diffraction line is asymmetric and the maximum intensity position shifts slightly from that of the centroid (see for example (12) or (13)). …”

Section: Lorentzian Approximation To the Mop 1(8) Distributionmentioning

confidence: 99%

“…As noted in Fig. 6, the fractional amplitude that is reflected is defined by: (12) and the fractional amplitude transmitted is defined by: in which we introduce the layer's structure factor per unit area. MF-MF1+iMF2, given by: 9 [ft 9 cos ¢z 9 + /2 9 sin ¢z 9 ] 9 MF2 = Em 9 [h 9 cos¢z 9 -ft 9 sin¢z 9 ] (14) for a distribution of mq atomic scatt~ring factor from a reference plane.…”

Section: Low Energy X-ray Scatteringmentioning

confidence: 99%

“…Presented here is an analytical model of the multilayer analyzer which we have recently introduced [12] that is based upon the calculation of reflected amplitude by summing the amplitudes scattered from the atoms comprising the multilayer structure.…”

Section: Analytical Models For Multilayer Analyzersmentioning

confidence: 99%

“…The analytical Darwin-Prins solution for reflected amplitude (16) was obtained by letting a and s be small as compared to unity [given in (12) and (13)…”

Section: A Low-angle Diffractionmentioning

confidence: 99%

See 2 more Smart Citations

Design and characterization of x-ray multilayer analyzers for the 50–1000 eV region

Henke

Gullikson

Kerner

et al. 1990

Journal of X-Ray Science and Technology

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More Recent Trends in X‐Ray Fluorescence Instrumentation

Jenkins¹

1999

X‐Ray Fluorescence Spectrometry

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Over the past 30 years or so, the X-ray fluorescence method has become one of the most valuable methods for the qualitative and quantitative analysis of materials. Many methods of instrumental elemental analysis are available today, and among the factors that will generally be taken into consideration in the selection of one of these methods are accuracy, range of application, speed, cost, sensitivity, and reliability. While it is certainly true is that no one technique can ever be expected to offer all of the features that a given analyst might desire, the X-ray method has good overall performance characteristics. In particular, the speed, accuracy, and versatility of X-ray fluorescence are the most important features among the many that have made it the method of choice in laboratories all over the world. Both the simultaneous wavelength dispersive spectrometer and the energy dispersive spectrometers lend themselves admirably to the qualitative and quantitative analysis of solid materials and solutions. Because the characteristic X-ray spectra are so simple, the actual process of allocating atomic numbers to the emission lines is relatively simple, and the chance of making a gross error is rather small. The relationship between characteristic line intensity and elemental composition is also now well understood, and if intensities can be obtained that are free from instrumental artifacts, excellent quantitative data can be obtained. Today, conventional X-ray fluorescence spectrometers allow the rapid quantification of all elements in the periodic table from fluorine (Z = 9) and upwards. Recent advances in wavelength dispersive spectrometers have extended this element range down to carbon (Z = 6). Over most of the measurable range, accuracies of a few tenths of one percent are possible, with detection limits down to the low ppm level. SCOPE OF THE X-RAY FLUORESCENCE METHODAs was indicated in the previous section, the basis of the X-ray fluorescence technique lies in the relationship between the wavelength (or energy) of the 123 X-Ray Fluorescence Spectrometry, Second Edition

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Characterization Of Multilayer X-Ray Analyzers: Models And Measurements

Cited by 43 publications

References 9 publications

A refined model for characterizing x-ray multilayers

A refined model for characterizing x-ray multilayers

Design and characterization of x-ray multilayer analyzers for the 50–1000 eV region

More Recent Trends in X‐Ray Fluorescence Instrumentation

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