2018
DOI: 10.1016/j.mssp.2018.08.007
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Characterization of N-type and P-type Aluminum Antimonides on Si substrates for room-temperature optoelectronic devices

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Cited by 5 publications
(2 citation statements)
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“…When Zn atoms substituted Al atoms, the crystal lattice of AlSb would have changed for the different atomic radius sizes of Al and Zn atoms, causing the AlSb crystal lattice to be distorted. Thus, the crystal lattice distortion appeared as a shift in Raman spectrum [19,20]. Approximately the same Raman shift indicated similar structural stress among the three AlSb:Zn thin films [21].…”
Section: Resultsmentioning
confidence: 96%
“…When Zn atoms substituted Al atoms, the crystal lattice of AlSb would have changed for the different atomic radius sizes of Al and Zn atoms, causing the AlSb crystal lattice to be distorted. Thus, the crystal lattice distortion appeared as a shift in Raman spectrum [19,20]. Approximately the same Raman shift indicated similar structural stress among the three AlSb:Zn thin films [21].…”
Section: Resultsmentioning
confidence: 96%
“…[ 26 ] AlSb also possesses a cubic crystal with a 5.9588 Å lattice. [ 37 ] Therefore, there is a lattice discrepancy between CTS and AlSb as well. Due to this disparity in lattice between the heterointerfaces, defects of 10 11 cm −2 were used in each heterostructure.…”
Section: Device Architecture and Methodologymentioning
confidence: 99%