2001
DOI: 10.1002/1521-4117(200110)18:3<142::aid-ppsc142>3.0.co;2-n
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Characterization of Nanophase Materials

Abstract: This contribution is a preprint of one chapter of Professor Wang's edited new book “Characterization of Nanophase Materials” (ISBN 3–527–29837–1), published by WILEY–VCH Verlag GmbH, Weinheim, Germany. Engineering of nanophase materials and devices is of vital interest in electronics, semiconductors and optics, catalysis, ceramics and magnetism. Development of nanotechnology involves several steps, of which characterization of nanoparticles is indespensable in understanding the behavior and properties of nanop… Show more

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Cited by 87 publications
(63 citation statements)
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“…[83,84] TEM is a high-spatial-resolution structural and chemical characterization tool. [85] A modern HRTEM has the capability to directly image atoms in crystalline specimens at resolutions close to 1 Å, smaller than the interatomic distance. This type of analysis is extremely important for characterizing materials at a length scale from atoms to hundreds of nanometers.…”
Section: Structure and Characterizationmentioning
confidence: 99%
“…[83,84] TEM is a high-spatial-resolution structural and chemical characterization tool. [85] A modern HRTEM has the capability to directly image atoms in crystalline specimens at resolutions close to 1 Å, smaller than the interatomic distance. This type of analysis is extremely important for characterizing materials at a length scale from atoms to hundreds of nanometers.…”
Section: Structure and Characterizationmentioning
confidence: 99%
“…uJê~ó=aáÑÑê~Åíáçå= The X-ray diffraction pattern of silver nanoparticle was recorded according to the method [11]. X-ray diffraction pattern was recorded in the scanning mode on an X'pert PRO PAN analytical instrument operated at 40 kV and a current of 30 mA with Cu K∝ radiation (λ = 1.5406 Å).…”
Section: Rsjsfp=pééåíêçëåçéó=mentioning
confidence: 99%
“…Using a JEOL-JEM-2100F electron microscope (JEOL Ltd, Tokyo, Japan) with an electron beam accelerated at 200 kV, and placing the sample on a gold grid with a holey carbon support film, micrographs were obtained from significant areas of the sample using the bright field technique, where crystalline parts in Bragg orientation appear dark and the amorphous or not Bragg-oriented parts appear bright. 23 Some electron diffraction patterns were also obtained from the sample using the selected-area diffraction technique, which projects a parallel incident electron beam, accelerated at 200 kV, over the sample and photographs the diffracted beam pattern. The pattern is a scaled representation of a section of the reciprocal lattice; each spot represents a plane in the crystal that has been diffracted.…”
Section: Transmission Electronic Microscopymentioning
confidence: 99%