Characterization of polymer thin films by phase‐sensitive acoustic microscopy and atomic force microscopy: a comparative review

Ngwa, Wilfred; Luo, Weili; Kamanyi, Albert E.; Fomba, Khanneh Wadinga; Grill, Wolfgang

doi:10.1111/j.1365-2818.2005.01484.x

Cited by 17 publications

(14 citation statements)

References 65 publications

(95 reference statements)

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“…Ngwa et al applied the phase-sensitive acoustic microscopy (PSAM) and AFM techniques for characterizing polymer thin films. 31 Their evaluation was based on results from three-dimensional vector contrast imaging for PSAM and multimodal imaging for AFM. In their review article, the similarities and differences between the information that can be extracted from the AFM topography and phase images and the PSAM phase and amplitude micrographs have been studied.…”

Section: Fractal Analysis Of Zno Thin Filmsmentioning

confidence: 99%

Zinc Oxide Thin Films Characterization, AFM, XRD and X-ray Reflectivity

2016

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In this study, surface structures of two zinc oxide (ZnO) thin films, prepared by sol-gel spin and dip-coating methods, were investigated. Ex situ Atomic Force Microscopy (AFM), X-ray diffraction (XRD), and X-ray reflectivity measurements were carried out in order to study the surface structure. XRD measurements showed nanostructured ZnO thin films with well-defined orientations. Fractal analysis was applied on the AFM data to illustrate the surface morphology of thin films. Fractal analysis provided a precious depiction of irregularities found in ZnO thin films and revealed that both interface width W and lateral correlation length ξ are strongly affected by coating method. Calculations showed that the film that was prepared by dip-coating had correlation length, interface width and fractal dimension of 56.2, 2.3, and 2.2 nm, respectively. These parameters for spin-coated sample were 354.8, 8.5, and 2.64 nm, respectively. Optimization of X-ray reflectivity by Genetic Algorithm optimization revealed structural parameters of thin films such as surface and interface roughness and thickness of the films. These calculations showed that dip-coated thin film has a smooth surface, whereas spin-coated thin film has a rough surface.

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Section: Fractal Analysis Of Zno Thin Filmsmentioning

confidence: 99%

Zinc Oxide Thin Films Characterization, AFM, XRD and X-ray Reflectivity

2016

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“…Using the appropriate inversion techniques, the micro-elastic properties of the blend can be determined from the surface wave velocity. We have treated the elastic properties of these polymer blends in a comparative review [11].…”

Section: Polymer Blend Thin Filmsmentioning

confidence: 99%

Combined phase-sensitive acoustic microscopy and confocal laser scanning microscopy

et al. 2006

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“…The simultaneously obtained PSAM phase image is significantly complementary to the amplitude image allowing access to information, which cannot be obtained by other ways. In the last years, PSAM's potential has been demonstrated for characterizing polymer thin films 7,8,9 . It has also been used to study the rigidity of the carapace in water fleas 10 .…”

Section: Introductionmentioning

confidence: 99%

Determination of sound velocity and acoustic impedance of thin chitosan films by phase-sensitive acoustic microscopy

Kamanyi

Mohamed

Ngwa

et al. 2010

Health Monitoring of Structural and Biological Systems 2010

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The biomaterial chitosan is used in the paper manufacturing industry, as a wound healing agent and in filtration amongst others. In this paper the longitudinal sound velocity and acoustic impedance of thin films of chitosan of varying thicknesses are determined by vector-contrast acoustic microscopy. The exploitation of the relative reflectivity information from the maximum amplitude images and a comparison of the experimentally obtained V(z) curves with simulations using appropriate models are applied for the evaluation of the sound velocity. These results were compared to those previously obtained results with the same instrument.

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Characterization of polymer thin films by phase‐sensitive acoustic microscopy and atomic force microscopy: a comparative review

Cited by 17 publications

References 65 publications

Zinc Oxide Thin Films Characterization, AFM, XRD and X-ray Reflectivity

Zinc Oxide Thin Films Characterization, AFM, XRD and X-ray Reflectivity

Combined phase-sensitive acoustic microscopy and confocal laser scanning microscopy

Determination of sound velocity and acoustic impedance of thin chitosan films by phase-sensitive acoustic microscopy

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