2024
DOI: 10.1094/phyto-09-23-0320-r
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Characterization of Quantitative Trait Loci for Leaf Rust Resistance in the Uzbekistani Wheat Landrace Teremai Bugdai

Xiangyang Xu,
Genqiao Li,
Guihua Bai
et al.

Abstract: Leaf rust, caused by Puccinia triticina Eriks. (Pt), is a major cause of wheat yield losses globally, and novel leaf rust resistance genes are needed to enhance wheat leaf rust resistance. Teremai Bugdai is a landrace from Uzebekistan that is highly resistant to many current races of Pt in the U.S.A. To unravel leaf rust resistance loci in Teremai Bugdai, a recombinant inbred line (RIL) population of Teremai Bugdai × TAM 110 was evaluated for response to Pt race Pt54-1 (TNBGJ) and genotyped using single nucleo… Show more

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