Characterization of RDX-Based Thermosetting Plastic-Bonded Explosive by Cone-Beam Microfocus Computed Tomography

Abstract

In this study microfocus computed tomography (lCT), a nondestructive technique, was used for 3D characterization of cyclotrimethylenetrinitramine (RDX)-based thermosetting plastic-bonded explosives. Quantitative information on RDX crystals including the packing status of the crystal and binder system, as well as the inner structure characteristics of partially solidified and fully solidified samples, was obtained using cone-beam lCT technology. The CT images show that the CT value of RDX crystal grains was obviously higher than that of crystal powder=binder. The results also show that after vacuum casting and thermosetting, the RDX grains were dispersed evenly and there were no air pores or cracks observed in the sample. Small pores exist inside the RDX grains with a porosity of less than 0.3%. The analysis results indicate high quality of the explosive part after employing thermosetting molding. The binder system and RDX crystals were integrated sufficiently, yet the grain packing was not maximum. The estimated average density and maximal difference in density of the sample were both in accordance with the testing results by Archimedes' method and it was proven that complete curing may enhance the overall density and density uniformity of the product.

Investigation on the Evolution of Nano-Scale Defects of CL-20 Crystals under Thermal Treatment by Wide/Small-Angle X-ray Scattering

“…In recent years, many techniques have been used to characterize the defects of explosive crystals, such as Computed Tomography (CT) [10], Optical Microscopes (OM) [11], Scanning Electron Microscopy (SEM) [12] and plane-polarized light microscopy [13]. However, the nano-scale defects of explosive crystals are difficult to detect effectively because the defects are distributed in the explosive crystal with a large number but small scale, and the explosive material easily decomposes under the high-energy stimulation from characterization methods.…”

Characterization of Nano-Scale Parallel Lamellar Defects in RDX and HMX Single Crystals by Two-Dimension Small Angle X-ray Scattering

“…The defects of explosive crystals at a micron scale are relatively easy to be characterized by Computed Tomography (CT) [12], Optical Microscopes (OM) [13], SEM [14], and planepolarized light microscopy [15]. Nano-scale defect is the microcosmic origin of damage evolution and macroscopic cracking of explosive charges.…”

Characterization of Cyclohexanone Inclusions in Class 1 RDX

“…The authors found no obvious correlations between the resistance to compaction and the sensitivity. A study of RDX compression by cone-beam micro-computed tomography, a non-destructive technique, was conducted by Zhang et al (20), and showed that fracture is strongly influenced by applied pressure and the shape of the crystal mold and that crack direction was roughly perpendicular to confinement forces by neighbor crystals. Zhang et al report that crack propagation usually started at inclusions.…”