2023
DOI: 10.1016/j.jpcs.2022.111095
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Characterization of Sb2Te3 thin films prepared by electrochemical technique

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Cited by 6 publications
(2 citation statements)
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“…Meanwhile, Te 3d displays a peak at 569.7 eV for Te 3d 5/2 , and 580.1 eV for Te 3d 3/2 [15,35]. Notably, higher binding energy peaks at 573.5 eV and 582.9 eV are attributed to tellurium oxide formation resulting from surface oxidation [36]. The values measured for S 2p, W 4f, Sb 3d, and Te 3d are consistent with reported values for WS 2 and Sb 2 Te 3 .…”
Section: Resultsmentioning
confidence: 99%
“…Meanwhile, Te 3d displays a peak at 569.7 eV for Te 3d 5/2 , and 580.1 eV for Te 3d 3/2 [15,35]. Notably, higher binding energy peaks at 573.5 eV and 582.9 eV are attributed to tellurium oxide formation resulting from surface oxidation [36]. The values measured for S 2p, W 4f, Sb 3d, and Te 3d are consistent with reported values for WS 2 and Sb 2 Te 3 .…”
Section: Resultsmentioning
confidence: 99%
“…The peak of Te‐3d 5/2 at 571.8 eV and the peak of Te‐3d 3/2 at 582.2 eV are clearly seen in the Figure 2j , which is in accordance with the literature XPS results reported for Sb 2 Te 3 . [ 30 ] In addition, a second set of peaks can be seen at higher binding energies of 539 and 529.7 eV for Sb‐3d 5/2 and Sb‐3d 3/2 , which are oxidation peaks formed due to surface oxidation. For tellurium, there is also a second set of weak peaks at higher binding energies, attributed to surface oxidation peaks of Te‐3d 3/2 (585.9 eV) and Te‐3d 5/2 (575.5 eV), respectively.…”
Section: Resultsmentioning
confidence: 99%