Characterization of Semiconductor Surface Conductivity by Using Microscopic Four-Point Probe Technique

Characterization of sol–gel coatings deposited on a mechanically treated stainless steel by using a simple non-destructive electrical method

“…The measurement method was the four point probe, a simple method which consists of passing a current through two outer probes and measuring the voltage through the inner probes, permitting the measurement of the resistivity and capacitance of the coated substrates under study. 45) A diagram of the equipment used to carry out the proposed electrical method is shown in Fig. 1.…”

Highly porous nickel@carbon sponge as a novel type of three-dimensional anode with low cost for high catalytic performance of urea electro-oxidation in alkaline medium

“…After deposition, the electrode was removed from the solution and washed with ultrapure water thoroughly, and air-dried. The resistances of the carbon sponge and Ni@carbon sponge electrode are around 4.7 U and 0.1 U per square, respectively, measured by a four point probe technique (FT-332, RICO) in which four sharp probes are mechanically pressed on the testing sample surface [26,27]. F.C.…”

The role of probe oxide in local surface conductivity measurements

“…1 Finally, collinear four point probe employs two outer probes to pass a current through the sample, while two inner high impedance sense probes measure the potential difference induced by the outer probes. 2 Despite the wide use of four point probe methods, there exists disagreement in the literature about whether the contact type of the four probes is important. While some claim the measurements are independent of contact and wire resistances regardless of the probe-sample contact type, 1,3-6 others have found that four point probe measurements will not give accurate results if the contact type is Schottky.…”

“…While some claim the measurements are independent of contact and wire resistances regardless of the probe-sample contact type, 1,3-6 others have found that four point probe measurements will not give accurate results if the contact type is Schottky. 2,[7][8][9][10] In order to address this, a short review of four point probe is presented and a model to describe the system is developed.…”

“…9, 22 Li and Ba state that the probes used for four point probe measurement need to be regularly cleaned to avoid the effect of probe surface oxidation and/or contamination, but as of 2012 they report that no work has been done to examine the effects of probe oxide. 2 For STS, Gimzewski 23 observed that leaving an iridium probe to degrade in ultra-high vacuum (UHV) changed the spectrum of a silver sample from Ohmic to Schottky, suggesting carbon or oxygen contamination of the probe. Studies carried out by Shen and Clemens show the effect on the STS spectra when a layer of indium oxide is deposited on InGaAs.…”