2020
DOI: 10.1088/1748-0221/15/05/c05027
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Characterization of Si and SiC detectors for laser-generated plasma monitoring in short wavelength range

Abstract: A: Silicon carbide detectors were employed to characterize the plasma produced by laser interaction with a double stream gas-puff target source. A 10 Hz repetition rate Nd:YAG laser (1064 nm wavelength, 0.69 J pulse energy and 3 ns pulse duration) was employed to irradiate different gas-puff targets (Argon, Xenon and Sulfur hexafluoride), at different pressures (1-10 bar), emitting plasma radiation in different wavelength ranges (ultraviolet, extreme ultraviolet and soft X-rays). The emission produced by the l… Show more

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Cited by 3 publications
(2 citation statements)
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“…SiC, in fact, has a surface metallization with 20 nm Ni 2 Si, which absorbs protons with energy lower than 3 keV. [23] SiC detects the X-rays emitted from the laser-generated plasma, confirming the trend obtained with the IC photopeak for the elements Ti, Ni, and NiTi.…”
Section: Laser Ablation In High Vacuumsupporting
confidence: 70%
See 1 more Smart Citation
“…SiC, in fact, has a surface metallization with 20 nm Ni 2 Si, which absorbs protons with energy lower than 3 keV. [23] SiC detects the X-rays emitted from the laser-generated plasma, confirming the trend obtained with the IC photopeak for the elements Ti, Ni, and NiTi.…”
Section: Laser Ablation In High Vacuumsupporting
confidence: 70%
“…SiC, in fact, has a surface metallization with 20 nm Ni 2 Si, which absorbs protons with energy lower than 3 keV. [ 23 ]…”
Section: Resultsmentioning
confidence: 99%