2020 IEEE International Memory Workshop (IMW) 2020
DOI: 10.1109/imw48823.2020.9108139
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Characterization of Single-Poly SGLC Cell Using 4kbits Array Test Chip for a Low Density Code Storage Embedded NVM Applications

Sung-Kun Park
1
,
Yong-Seop Lee
2
,
Do-Hee Kim
3
et al.
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