Characterization of synthetic diamond crystals by spatially resolved rocking curve measurements

Hoszowska, J.; Freund, Andreas K.; Boller, E; Sellschop, J.P.F.; Level, G; Härtwig, J.; Burns, Robert C.; Rebak, M.; Baruchel, J.

doi:10.1088/0022-3727/34/10a/311

Cited by 111 publications

(21 citation statements)

References 5 publications

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“…The RCI technique, in both projection (Lü bbert et al, 2000(Lü bbert et al, , 2005Hoszowska et al, 2001;Mikulík et al, 2006;Calamiotou et al, 2007) and section (Kluender et al, 2011;Philip et al, 2013) modes, in transmission, was used to characterize the defects in mono-like Si. Several previous studies (Lafford et al, 2013;Tsoutsouva et al, 2014Tsoutsouva et al, , 2015Tran Thi et al, 2015) have proved that RCI using synchrotron light is a powerful tool for performing this characterization.…”

Section: Experimental Procedures 21 Transmission Rocking Curve Imagimentioning

confidence: 99%

Characterization of defects in mono-like silicon for photovoltaic applications using X-ray Bragg diffraction imaging

et al. 2015

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Rocking curve imaging (projection and section X-ray topography) has been used to study the generation and propagation of defects at the junctions between and above the seed crystals in mono-like silicon ingots. The images of different kinds of defects such as precipitates, dislocations and twins in the integrated intensity, full width at half-maximum and peak position maps resulting from the experiment have been studied. The qualitative and quantitative information that can be extracted from these maps, in particular the contrast of the images of the various defects, is discussed. These defects have a detrimental effect on solar cell efficiency and their detailed investigation allows clues to be obtained in order to improve the growth process. This work shows that synchrotron X-ray diffraction imaging techniques, because of their high angular resolution (<10 À4 ) and large field of view (several mm 2 ), constitute a powerful tool for investigating the initial stages of growth of directionally solidified mono-like silicon.

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Section: Experimental Procedures 21 Transmission Rocking Curve Imagimentioning

confidence: 99%

Characterization of defects in mono-like silicon for photovoltaic applications using X-ray Bragg diffraction imaging

et al. 2015

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“…All the above imperfections of the diamond crystal will cause the variation of the lattice constant and/or the change of orientation of the lattice plane. These changes can be measured by experimental methods such as the high resolution X‐ray topography and rocking curve measurements 9–14, Raman spectroscopy 15, TEM 16, polarized light microscopy 17, etc. The coherent bremsstrahlung process can also be used to check the crystal quality; however, it needs a dedicated high energy electron beam line.…”

Section: Introductionmentioning

confidence: 99%

High resolution X‐ray diffraction study of single crystal diamond radiators

Yang

Livingston

Jones

et al. 2012

Physica Status Solidi (a)

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High quality single crystal diamond is widely used for generating highly polarized high energy photon beams in the photonuclear physics study. The quality of the diamond crystal has a vital effect on the polarization of the photon beam which should be as high as possible as required by the experiments at Jefferson Lab, MAX_lab and MAMI, etc. One 20 µm thick diamond radiator from Jefferson lab and one 100 µm thick diamond radiator from MAMI were investigated by X‐ray rocking curve and topograph measurements. The rocking curve results suggest that the 20 µm thick diamond radiator is severely deformed which explains why this diamond radiator showed unstable performance in the coherent bremsstrahlung experiments. The 100 µm thick diamond radiator was radiation damaged after being used in an 855 MeV electron beam line for several years. At the radiation damage region, it was found that the rocking curve width is significantly broadened, and the rocking curve peak position shifted towards the larger angle side by around 200 arcsec. Raman test confirmed that a significant amount non‐diamond phase exist at the radiation damage region.

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“…The RCI technique can be used in both reflection (Bragg) and transmission (Laue) geometries. Developments have been reported using the Laue geometry carried out in both projection (Lü bbert et al, 2000(Lü bbert et al, , 2005Hoszowska et al, 2001;Calamiotou et al, 2007) and section (Kluender et al, 2011;Pernot et al, 2010;Tran Thi et al, 2015) modes. Information is extracted on a pixel-by-pixel basis from a series of typically several hundred X-ray diffraction images recorded at small angular steps of the crystal rotation or rocking angle [ in Fig.…”

Section: Description Of the Samplesmentioning

confidence: 99%

Synchrotron Bragg diffraction imaging characterization of synthetic diamond crystals for optical and electronic power device applications

et al. 2017

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Bragg diffraction imaging enables the quality of synthetic single-crystal diamond substrates and their overgrown, mostly doped, diamond layers to be characterized. This is very important for improving diamond-based devices produced for X-ray optics and power electronics applications. The usual first step for this characterization is white-beam X-ray diffraction topography, which is a simple and fast method to identify the extended defects (dislocations, growth sectors, boundaries, stacking faults, overall curvature etc.) within the crystal. This allows easy and quick comparison of the crystal quality of diamond plates available from various commercial suppliers. When needed, rocking curve imaging (RCI) is also employed, which is the quantitative counterpart of monochromatic Bragg diffraction imaging. RCI enables the local determination of both the effective misorientation, which results from lattice parameter variation and the local lattice tilt, and the local Bragg position. Maps derived from these parameters are used to measure the magnitude of the distortions associated with polishing damage and the depth of this damage within the volume of the crystal. For overgrown layers, these maps also reveal the distortion induced by the incorporation of impurities such as boron, or the lattice parameter variations associated with the presence of growthincorporated nitrogen. These techniques are described, and their capabilities for studying the quality of diamond substrates and overgrown layers, and the surface damage caused by mechanical polishing, are illustrated by examples.

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Characterization of synthetic diamond crystals by spatially resolved rocking curve measurements

Cited by 111 publications

References 5 publications

Characterization of defects in mono-like silicon for photovoltaic applications using X-ray Bragg diffraction imaging

Characterization of defects in mono-like silicon for photovoltaic applications using X-ray Bragg diffraction imaging

High resolution X‐ray diffraction study of single crystal diamond radiators

Synchrotron Bragg diffraction imaging characterization of synthetic diamond crystals for optical and electronic power device applications

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