2018
DOI: 10.1007/978-3-319-95138-6_4
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Characterization of Textured Structures

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“…[44] Surface roughness can strongly affect light scattering. [45] The complex refractive index or dielectric function tensor, which provides access to fundamental physical parameters, is related to various sample properties, including morphology, crystal quality, chemical composition, and electrical conductivity. [46] X-ray diffraction (XRD)-based characterization techniques, including conventional laboratory-based XRD and synchrotron-based grazing-incidence wide-angle X-ray scattering (GIWAXS) (Figure 2c), are widely used to provide information on a material's crystallographic structure, phases, preferred crystal orientations, chemical composition, and other physical properties related to the crystallinity of the material.…”
Section: Characterization Techniques For Studying the Interfaces In Pscsmentioning
confidence: 99%
“…[44] Surface roughness can strongly affect light scattering. [45] The complex refractive index or dielectric function tensor, which provides access to fundamental physical parameters, is related to various sample properties, including morphology, crystal quality, chemical composition, and electrical conductivity. [46] X-ray diffraction (XRD)-based characterization techniques, including conventional laboratory-based XRD and synchrotron-based grazing-incidence wide-angle X-ray scattering (GIWAXS) (Figure 2c), are widely used to provide information on a material's crystallographic structure, phases, preferred crystal orientations, chemical composition, and other physical properties related to the crystallinity of the material.…”
Section: Characterization Techniques For Studying the Interfaces In Pscsmentioning
confidence: 99%