2010
DOI: 10.1002/pssc.200982780
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Characterization of the common mode rejection ratio of amorphous silicon balanced photodiode

Abstract: In this work we report on the detailed characterization of an amorphous silicon/amorphous silicon carbide balanced photodiode structure suitable for differential photocurrent measurements. The device is a three-terminal structure constituted by two series-connected amorphous silicon p-i-n photodiodes. Two terminals are used to bias the two photodiodes at the same reverse voltage by the readout electronics. The output signal is the current difference between the two diodes, measured at the third terminal with a… Show more

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