2023
DOI: 10.1016/j.mne.2023.100191
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Characterization of the dynamics of encapsulated silicon MEMS devices using low-coherence heterodyne LDV technology

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Cited by 2 publications
(2 citation statements)
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“…Then, 50:50 BS1 splits the reference beam into beam1 and beam2 on average. (6) Beam1 and echo3 are combined by 50:50 BS2 from different directions. Then, two beams propagate to PBS3 together and produce two interference signals I1 and I2 which are received by PD1 (photodetector) and PD2 respectively.…”
Section: Measurement Principlesmentioning
confidence: 99%
See 1 more Smart Citation
“…Then, 50:50 BS1 splits the reference beam into beam1 and beam2 on average. (6) Beam1 and echo3 are combined by 50:50 BS2 from different directions. Then, two beams propagate to PBS3 together and produce two interference signals I1 and I2 which are received by PD1 (photodetector) and PD2 respectively.…”
Section: Measurement Principlesmentioning
confidence: 99%
“…It is an alternative to the conventional contacting vibration sensors. With the advantages of wide frequency response and high spatial resolution [1], LDV has been widely used in acoustics [2], automobile manufacturing [3], aerospace [4], quality inspection [5], and MEMS systems [6]. However, speckle noise caused by the laser speckle effect is the dominant factor limiting the development of LDV.…”
Section: Introductionmentioning
confidence: 99%