The Materials Science of Thin Films 1992
DOI: 10.1016/b978-0-08-051118-4.50012-8
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Characterization of Thin Films

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Cited by 1,000 publications
(1,286 citation statements)
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“…The deposition method of a thin film can greatly affect the material properties of the layer [10]. The top ARROW layer needs to be deposited at a relatively low temperature (<300°C) in order to protect the device from damage during deposition.…”
Section: Deposit Top Arrow Layersmentioning
confidence: 99%
See 1 more Smart Citation
“…The deposition method of a thin film can greatly affect the material properties of the layer [10]. The top ARROW layer needs to be deposited at a relatively low temperature (<300°C) in order to protect the device from damage during deposition.…”
Section: Deposit Top Arrow Layersmentioning
confidence: 99%
“…These include PECVD, sputter deposition, and spin-on deposition using a spin-on-glass (SOG). Theoretically, sputter deposition should yield a dense and conformal SiO2 film [10]; however, sputtered SiO2 tends to show structural failure during the sacrificial core etch. Spin-on glass deposition also failed to produce layers that could withstand the sacrificial core etch, leaving PECVD as our only viable deposition method.…”
Section: Deposit Top Arrow Layersmentioning
confidence: 99%
“…The radius of curvature was deduced from the bow and used to calculate the stress of the Pyrex chip bonded on the metallic plate according to the following formula [13]:…”
Section: Thermal Stressmentioning
confidence: 99%
“…It is well known that above mentioned properties depend on thin films deposition method and growth conditions [9]. Currently, the magnetron sputtering [10] and chemical methods, namely chemical bath [11e13], photochemical [14], and electrochemical deposition [15,16] etc., are the most used techniques for growth of CdSe films.…”
Section: Introductionmentioning
confidence: 99%