Characterization system for Large Area Electronic Systems

Abstract

Large area electronic systems use either an active or passive matrix sensory back plane as the major component in the system design. These backplanes are vulnerable to interconnection errors and poor device performances. Hence reliability studies pertaining to the systems of these order are relevant. In this paper we discuss the development of a sensor array characterization system which can not only detect interconnect faults, but also characterize the access switches in the array. Switched capacitor circuits based on n channel MOSFETs and RC networks are used for demonstrating the utility of the system in active addressing and passive addressing schemes respectively. In Switched capacitor circuit based backplane, an approximate transfer characteristics is obtained by measuring the time averaged current through the MOSFET in response to an applied gate voltage, while time constant estimation is done for characterizing the RC networks.