Characterization Tools of Ultrathin Oxide Films

Grinter, David C.; Thornton, G.

doi:10.1002/9783527640171.ch2

Cited by 3 publications

(2 citation statements)

References 84 publications

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“…Synchrotron-based X-ray photoemission electron microscopy (XPEEM) has previously been used to investigate ultrathin metal oxides . XPEEM and high resolution low energy electron microscopy (LEEM) are powerful tools which have been used with effect in the analysis of ultrathin oxide film systems such as TiO x /Pt(111) and VO x /Rh(111) and recently ceria on Ru(0001) and Cu(111) …”

Section: Introductionmentioning

confidence: 99%

Oxidation State Imaging of Ceria Island Growth on Re(0001)

et al. 2013

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High resolution X-ray photoemission electron microscopy (XPEEM) and low energy electron microscopy (LEEM) have been used to investigate the growth of ultrathin CeO x (111) on Re(0001), a model catalyst system. Rotational domains of CeO x (111) are identified with microprobe low energy electron diffraction (LEED) and dark-field LEEM. In the regions not covered by the ceria islands, a surface rhenium-oxide layer has been observed using energy-filtered XPEEM imaging and spectroscopy. The oxidation state of the ceria is key to its catalytic activity. For this reason we have employed resonant photoelectron spectroscopy of the Ce 4f contributions to the valence band to monitor the relative Ce3+ and Ce4+ concentrations. The overall stoichiometry of the moderately reduced film was CeO1.63. Resonant energy-filtered XPEEM imaging of the Ce oxidation state allowed us to confirm the uniformity of this stoichiometry across the ceria islands that constituted the film.

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Section: Introductionmentioning

confidence: 99%

Oxidation State Imaging of Ceria Island Growth on Re(0001)

et al. 2013

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“…Despite their discovery in the early 1990s, a comprehensive atomic understanding of “29” and “44” structures remains elusive, prompting over three decades of extensive studies. Technological advancements in scanning tunneling microscopy (STM), − low-energy electron diffraction (LEED), , and surface X-ray diffraction (SXRD) , have enabled atomic-level examination of these surfaces. However, inherent limitations in spatial resolution and the ability to identify specific elemental information have left gaps in our understanding.…”

Section: Introductionmentioning

confidence: 99%

Vacancy Ordering in Ultrathin Copper Oxide Films on Cu(111)

Zhu,

Huang,

Lin

et al. 2024

J. Am. Chem. Soc.

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Oxide thin films grown on metal surfaces have wide applications in catalysis and beyond owing to their unique surface structures compared to their bulk counterparts. Despite extensive studies, the atomic structures of copper surface oxides on Cu(111), commonly referred to as “44” and “29”, have remained elusive. In this work, we demonstrated an approach for the structural determination of oxide surfaces using element-specific scanning tunneling microscopy (STM) imaging enhanced by functionalized tips. This approach enabled us to resolve the atomic structures of “44” and “29” surface oxides, which were further corroborated by noncontact atomic force microscopy (nc-AFM) measurements and Monte Carlo (MC) simulations. The stoichiometry of the “44” and “29” frameworks was identified as Cu23O16 and Cu16O11, respectively. Contrary to the conventional hypothesis, we observed ordered Cu vacancies within the “44” structure manifesting as peanut-shaped cavities in the hexagonal lattice. Similarly, a combination of Cu and O vacancies within the “29” structure leads to bean-shaped cavities within the pentagonal lattice. Our study has thus resolved the decades-long controversy on the atomic structures of “44” and “29” surface oxides, advancing our understanding of copper oxidation processes and introducing a robust framework for the analysis of complex oxide surfaces.

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Structure Concepts in Two-Dimensional Oxide Materials

Netzer

Surnev

2016

Oxide Materials at the Two-Dimensional Limit

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Characterization Tools of Ultrathin Oxide Films

Cited by 3 publications

References 84 publications

Oxidation State Imaging of Ceria Island Growth on Re(0001)

Oxidation State Imaging of Ceria Island Growth on Re(0001)

Vacancy Ordering in Ultrathin Copper Oxide Films on Cu(111)

Structure Concepts in Two-Dimensional Oxide Materials

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