2009 34th IEEE Photovoltaic Specialists Conference (PVSC) 2009
DOI: 10.1109/pvsc.2009.5411301
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Characterizing antireflection coatings on textured monocrystalline silicon with Spectroscopic Ellipsometry

Jianing Sun
1
,
M. F. Saenger
2
,
M. Schubert
3
et al.
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Quantifying the optical losses in back-contact solar cells

McIntosh1,
Kho
2
,
Fong
3
et al. 2014
2014 IEEE 40th Photovoltaic Specialist Conference (PVSC)
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Quantifying the optical losses in back-contact solar cells

McIntosh1,
Kho
2
,
Fong
3
et al. 2014
2014 IEEE 40th Photovoltaic Specialist Conference (PVSC)
28
0
15
0
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Thin-film metrology of tilted and curved surfaces by imaging Mueller-matrix ellipsometry

Duwe1,
Quast2,
Schneider3
et al. 2019
Journal of Vacuum Science &Amp; Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phen
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