2018
DOI: 10.1007/s10948-018-4923-1
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Characterizing the Distribution of Microwave Surface Resistance of HTS Film Based on Metal Ring

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“…Since the MSR determines the metal power loss and the metal power loss is closely related to the quality factor of the microwave resonator, the MSR can be calculated based on the measurement of the quality factor of the resonator. At present, hollow resonant cavities [13][14][15] and dielectric resonators [16][17][18][19] are mainly used for the MSR measurement. For the former, part of the cavity wall is replaced with a metal under test (MUT), and the change in quality factor of the cavity before and after replacement can be used to extract the MSR of the MUT.…”
Section: Introductionmentioning
confidence: 99%
“…Since the MSR determines the metal power loss and the metal power loss is closely related to the quality factor of the microwave resonator, the MSR can be calculated based on the measurement of the quality factor of the resonator. At present, hollow resonant cavities [13][14][15] and dielectric resonators [16][17][18][19] are mainly used for the MSR measurement. For the former, part of the cavity wall is replaced with a metal under test (MUT), and the change in quality factor of the cavity before and after replacement can be used to extract the MSR of the MUT.…”
Section: Introductionmentioning
confidence: 99%