Characterizing the Performance of Eddy Current Probes Using Photoinductive Field-Mapping

Moulder, John C.; Nakagawa, N.

doi:10.1080/09349849209409536

Cited by 10 publications

(4 citation statements)

References 5 publications

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“…The method experimentally showed the high-resolution capability inherent in this technique by adapting a photoinductive sensor developed for a fiber optic probe to an existing photoacoustic microscope [2]. The same method will work equally well to characterize cracks on thick metals.…”

Section: Introductionmentioning

confidence: 88%

“…Moulder et al [1] showed that this new technique dramatically increased image resolutions, and could be used to calibrate and characterize eddy current probes [2][3][4]. The method experimentally showed the high-resolution capability inherent in this technique by adapting a photoinductive sensor developed for a fiber optic probe to an existing photoacoustic microscope [2].…”

Section: Introductionmentioning

confidence: 99%

See 1 more Smart Citation

Finite Element Method Simulation of Photoinductive Imaging for Cracks

Tai¹,

Pan²

2008

PIER Letters

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Abstract-In this paper, the numerical simulations of photoinductive imaging (PI) method have been performed using the finite element method (FEM) with the 2D transient to characterize corner cracks at the edge of a bolt hole. The PI imaging results have higher spatial resolution in the area of the defect in 2D models as compared with the conventional eddy current (EC) images. The FEM simulation results of 0.5-mm rectangular defects are showed and analyzed. The dependencies of PI signals on EC frequencies and temperature of the thermal spot are also examined. The results demonstrate that the PI method is applicable to examine the geometric shape of corner cracks.

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Section: Introductionmentioning

confidence: 88%

Section: Introductionmentioning

confidence: 99%

Finite Element Method Simulation of Photoinductive Imaging for Cracks

Tai¹,

Pan²

2008

PIER Letters

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“…It is also an ideal field-mapping technique that provides high spatial resolution and high sensitivity to the tangential component of the electromagnetic field without perturbation when characterizing the electromagnetic field of eddy-current (EC) probes [2][3][4][5]. Fieldmapping images for commercial EC probes can be obtained by PI method with a 20-µm thick gold film on an insulating glass substrate [3]. The experimental results obtained by PI field-mapping, however, do not consider the effects of thermal and electrical properties of the thin film, which leads to insufficient data for mapping more distinct field distributions of EC probes.…”

Section: Introductionmentioning

confidence: 99%

Effects of Thermal and Electrical Properties of Thin Metal Film in Photoinductive Field-Mapping Technique for Eddy-Current Probes

Pan¹,

Tai²

2011

PIER B

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Abstract-Photoinductive (PI) field mapping for eddy-current (EC) probes above a thin metal film was performed by multiphysics analysis with two-dimensional finite element method (FEM). The FEM model of PI method was used to observe how metal film properties affect the field-mapping signals of EC probes. The PI signal was tested for effects of resistivity, temperature coefficient of the resistivity, thermal conductivity, heat capacity, and thin film density The applicability of actual thin film materials for mapping the field of EC probe when using PI method was discussed. Field-mapping signals of EC probe coils with tilt angles of 0 • , 5 • , 10 • , 15 • , and 20 • were also examined with appropriate metal film material. These experiments showed that the higher-resolution field-mapping signals of EC probes can be obtained by given a titanium thin film The resolution of field-mapping signals of EC probes correlated positively with resistivity, heat capacity, and density of thin film and correlated negatively with its thermal conductivity. Improved understanding of distinct field distribution of EC probes enables selection of optimal probes for EC inspection.

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“…Thermal waves produce a localized modulation of electrical conductivity in the specimen, which can be detected through its effect on the impedance of a nearby eddy current coil. Moulder, and others [2][3][4] showed that this new technique can also be used to calibrate and characterize eddy current probes. This probe characterization method offers a means to determine the electric field intensity of eddy current probes, a quantity that is directly related to their performance for flaw detection and characterization.…”

Section: Introductionmentioning

confidence: 99%