1995
DOI: 10.4028/www.scientific.net/msf.196-201.55
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Charactrization of Residual Transition Metal Ions in GaN and AIN

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Cited by 17 publications
(6 citation statements)
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“…One might notice that according to the result of the mHSE calculation there is no double positive charge state, because in the positive charge state of Cr Al all of the occupied defect states fall into the valence band. On the other hand there are experimental indications 78,79 and theoretical predictions 80 of the existence of Cr 5+ in w-AlN. This contradiction may indicate the inaccuracy of the mHSE functional and the necessity of the correction.…”
Section: B Cr Al In W-alnmentioning
confidence: 96%
“…One might notice that according to the result of the mHSE calculation there is no double positive charge state, because in the positive charge state of Cr Al all of the occupied defect states fall into the valence band. On the other hand there are experimental indications 78,79 and theoretical predictions 80 of the existence of Cr 5+ in w-AlN. This contradiction may indicate the inaccuracy of the mHSE functional and the necessity of the correction.…”
Section: B Cr Al In W-alnmentioning
confidence: 96%
“…Based on a comparison with the position of the Mn 2+ acceptor level (with respect to the vacuum energy) in GaAs, GaP and InP, the Mn 2+ level in GaN is expected at 2.0 ± 0.1 eV above the valence band [10]. Therefore, the ansorption peak is more likely related to the neutral Mn 3+ acceptor state.…”
Section: Discussionmentioning
confidence: 99%
“…GaN is considered to be one of the most promising semiconductor materials for the construction of short-wavelength emitting devices, such as blue diodes and lasers [1]. Since transition-metal impurities in semiconductors are known to be a practically unavoidable contamination and the presence of these impurities can influence the semiconductors characteristics and device performance, the identification and study of these impurities in GaN by using spectroscopy methods have attracted research interest [2][3][4][5][6][7]. A zero-phonon line (ZPL) at 1.193 eV in GaN was found using the optical spectrum measurements [3][4][5][6].…”
Section: Introductionmentioning
confidence: 99%
“…Since transition-metal impurities in semiconductors are known to be a practically unavoidable contamination and the presence of these impurities can influence the semiconductors characteristics and device performance, the identification and study of these impurities in GaN by using spectroscopy methods have attracted research interest [2][3][4][5][6][7]. A zero-phonon line (ZPL) at 1.193 eV in GaN was found using the optical spectrum measurements [3][4][5][6]. The identification of this ZPL with a 1 E → 3 A 2 transition of a 3d 2 configuration is beyond question [5,7].…”
Section: Introductionmentioning
confidence: 99%
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