Abstract:The electronic structure of the quasi-one dimensional conductor K 0.3 MoO 3 has been measured using high resolution resonant inelastic x-ray scattering and x-ray absorption spectroscopy. The data is compared to that from the related two dimensional insulator α-MoO 3. Scattering features are observed from both oxides that are explained in terms of the band momentum selectivity of the scattering process, allowing a comparison of the scattering data to recent band structure calculations.PACS: 78.70.En 2 Synchrotron radiation excited resonant inelastic x-ray scattering (RIXS) and soft x-ray emission spectroscopy (XES) are emerging as important probes of electronic structure in complex materials. XES allows the local, element-and site-specific partial density of states (PDOS) to be measured for valence band states, while RIXS measures low energy valence excitations with the same element and site specificity.1,2 An interesting issue in the application of these spectroscopies is their sensitivity to the dimensionality of the sample. We report here an exploration of dimensional effects in soft x-ray emission and scattering from the prototypical low dimensional transition metal oxide K 0.3 MoO 3 ("blue bronze"). X-rays scattered at the O K-edge were found to be sensitive to the band momentum, k. This is unexpected since the strong quasi- Our results provide new insight on the electronic structure of molybdenum oxide bronzes.Quasi-one dimensional (1D) transition metal oxides have been studied for many years since they exhibit some of the most complex electronic behavior in solids. Strong electronelectron and electron-phonon interactions lead to phenomena such as charge density waves, superconductivity, periodic lattice distortions, and Peierls transitions. 5,6 K 0.3 MoO 3 is a member of a large class of quasi-low dimensional layered materials, the Mo oxide bronzes, 7 and displays a strongly anisotropic electronic structure. 4,6 The parent compound α-MoO 3 has a related crystal structure, but is a quasi-two dimensional (2D) insulator. Despite the enduring interest in these materials, there have been few measurements of their electronic structure using RIXS or resonant soft x-ray emission spectroscopy XES. 8 RIXS can be used, under the proper circumstances, to probe the k resolved band structure of solids. [9][10][11] The mechanism that provides k selectivity is emitted photons with a polarization perpendicular to that of the incident photons. We are unable to measure RIXS with the incident photon polarization vector exactly parallel to either the sample surface or the sample surface normal, but must move approximately 15< away from the desired axis to allow x-rays to both enter and exit the sample in the appropriate directions. All of the RIXS/XES spectra are normalized to the main peak maximum, so all noted intensity changes are relative to the peak of the observed emission at 526