2020
DOI: 10.1088/1361-6382/ab5f6e
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Charge induced acceleration noise in the LISA gravitational reference sensor

Abstract: The presence of free charge on isolated proof-masses, such as those within spaceborne gravitational reference sensors, causes a number of spurious forces which will give rise to associated acceleration noise. A complete discusssion of each charge induced force and its linear acceleration noise is presented. The resulting charge acceleration noise contributions to the LISA mission are evaluated using the LISA Pathfinder performance and design. It is shown that one term is largely dominant but that a full budget… Show more

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Cited by 28 publications
(16 citation statements)
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“…The UV power at the input of the vacuum chamber port has been measured for all measurements shown here, combined with the fiber optic transmission inside the vacuum chamber, the power reaching the sensor was P UV = 150 ± 10nW for each measurement run. The quantum yield of similar gold surfaces has been studied in [16,17,31,38]. In systems which are allowed to stabilize over long periods ( weeks-months), the quantum yield of has been found in several circumstances to approach ∼ 2 ± 0.5 × 10 −5 for a light source with a similar wavelength as used here.…”
Section: Measuring Model Parameters and Tracking Photonsmentioning
confidence: 95%
See 2 more Smart Citations
“…The UV power at the input of the vacuum chamber port has been measured for all measurements shown here, combined with the fiber optic transmission inside the vacuum chamber, the power reaching the sensor was P UV = 150 ± 10nW for each measurement run. The quantum yield of similar gold surfaces has been studied in [16,17,31,38]. In systems which are allowed to stabilize over long periods ( weeks-months), the quantum yield of has been found in several circumstances to approach ∼ 2 ± 0.5 × 10 −5 for a light source with a similar wavelength as used here.…”
Section: Measuring Model Parameters and Tracking Photonsmentioning
confidence: 95%
“…The work function values returned by the fit are given in Equation (17). While the work function value for the EH surfaces measured with EH and TM ports illumination are consistent at the 1σ level, the values for TM surfaces are in tension.…”
Section: Measuring Model Parameters and Tracking Photonsmentioning
confidence: 95%
See 1 more Smart Citation
“…"In-band" additive actuation voltage noise mixes with any stray DC potential differences-from patch potentials and TM charge [27][28][29][30][31] -to cause low frequency force noise. We can describe this by a change in force from one electrode by ∆F ≈ ∂C X ∂x ∆V DC v n , where ∆V is some stable DC potential difference between electrode and TM, and v n is some electrode actuation voltage fluctuation.…”
Section: In-band Actuation Voltage Noise and Low Frequency Electrosta...mentioning
confidence: 99%
“…For ESA with strictly symmetric voltage distribution and geometrical structure, the induced voltage U i is zero while in equilibrium position. Ignoring the coupling effect between electrodes with different functions, the electrostatic force on the mass in single direction can be expressed as [18,33]…”
Section: Model Of Charge Distribution and Electrostatic Force In Esamentioning
confidence: 99%