2021
DOI: 10.48550/arxiv.2112.02047
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Charge-induced artifacts in non-local spin transport measurements: How to prevent spurious voltage signals

F. Volmer,
T. Bisswanger,
A. Schmidt
et al.

Abstract: To conduct spin-sensitive transport measurements, a non-local device geometry is often used to avoid spurious voltages that are caused by the flow of charges. However, in the vast majority of reported non-local spin valve, Hanle spin precession, or spin Hall measurements background signals have been observed that are not related to spins. We discuss seven different types of these charge-induced signals and explain how these artifacts can result in erroneous or misleading conclusions when falsely attributed to … Show more

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