2010
DOI: 10.1063/1.3466776
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Charge separation and recombination in radial ZnO/In2S3/CuSCN heterojunction structures

Abstract: A ZnO-nanorod/In2S3/CuSCN radial hetero structure has recently shown promising photovoltaic conversion efficiencies. In this work, the charge separation and recombination in single ZnO/ In2S3 and In2S3/CuSCN interfaces as well as the complete ZnO/In2S3/CuSCN structure were studied by time resolved microwave photoconductivity. Photoconductivity transients were measured for different thicknesses of the In2S3 light absorbing layer, under variation of the exciting light flux and before and after annealing of the Z… Show more

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Cited by 10 publications
(10 citation statements)
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“…Afterward the decay slows down and crosses over to a slow hundreds of ps long rise. From the earlier experiments it is known that a long-lived (μs) charge separated state is formed in this material. Hence, the most natural explanation for the delayed rise is the migration of electrons from the In 2 S 3 phase to the ZnO phase.…”
Section: Resultsmentioning
confidence: 99%
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“…Afterward the decay slows down and crosses over to a slow hundreds of ps long rise. From the earlier experiments it is known that a long-lived (μs) charge separated state is formed in this material. Hence, the most natural explanation for the delayed rise is the migration of electrons from the In 2 S 3 phase to the ZnO phase.…”
Section: Resultsmentioning
confidence: 99%
“…Hence R ( t ) can be simplified to k 2 n 2 . It is also reasonable to assume that all photogenerated charge carriers have recombined on the interpulse time scale of 6.7 μs (due to the repetition rate of the laser) as the conductivity has completely vanished after that time …”
Section: Resultsmentioning
confidence: 99%
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“…Belaidi et al have pointed out that the variation of I-V parameters is related to the thickness of absorber on the ZnO surface. 16 In our case, the absorbance of the photoanode is increased with the increase in applied voltage, thereby leading to an increased J sc . With the increased thickness of CdSe QDs on the ZnO surface, the shunt resistance of the cell is largely increased, leading to a increase in V oc from 0.47 to 0.58 V, and FF from 29.9 to 47.4%.…”
mentioning
confidence: 89%
“…The series resistance is increased, resulting in a decreased FF and PCE value due to the lower diffusion length of QD than that of the photo-generated charge carriers. 16 Therefore, the maximum PCE value of QDSSC is 0.74% with J sc = 2.70 mA cm…”
mentioning
confidence: 99%