2012
DOI: 10.1063/1.4720080
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Charge transport and trap characterization in individual GaSb nanowires

Abstract: Charge transport of unintentionally doped GaSb nanowires was studied through the fabrication and analysis of nanowire field effect transistors (FETs). In this work, both temperature dependent and voltage dependent measurements demonstrate various operating regimes, including a transition from linear current-voltage behavior at low bias to a space-charge limited current (SCLC) at large bias. Analysis of the voltage and temperature variation in the SCLC regime provided quantitative information about the trap ene… Show more

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Cited by 37 publications
(41 citation statements)
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“…The SCLC approach to study the characteristic parameters of individual nanowires, such as concentration of charge traps and their activation energy, from current-voltage characteristics has been discussed recently. [12][13][14][15] Bismuth sulfide (Bi 2 S 3 ) is a direct band gap semiconductor (E g -1.3 eV) with n-type conduction. It has a great potential for application in resistive memory devices due to its specific intrinsic doping with sulfur vacancies that can play a key role in resistive switching.…”
Section: Introductionmentioning
confidence: 99%
“…The SCLC approach to study the characteristic parameters of individual nanowires, such as concentration of charge traps and their activation energy, from current-voltage characteristics has been discussed recently. [12][13][14][15] Bismuth sulfide (Bi 2 S 3 ) is a direct band gap semiconductor (E g -1.3 eV) with n-type conduction. It has a great potential for application in resistive memory devices due to its specific intrinsic doping with sulfur vacancies that can play a key role in resistive switching.…”
Section: Introductionmentioning
confidence: 99%
“…4,24 We further note that the post DEP thermal anneal step helps to eliminate the presence of mid-gap states at the Au-CuO interface, which can otherwise lead to Fermi level pinning. 25 Second, we obtain a poor fit of our data with the operational form 26 of the back-toback Schottky diode (see characteristic fitting in supplementary material 27 S1 for IV obtained at 260 K). Finally, as we show next, a low voltage, linear IV is observed in all our data which is not characteristic of back-to-back Schottky conduction mechanism, either.…”
mentioning
confidence: 99%
“…The extracted hole density decreases drastically for D NW < 50 nm [ Figure 3(c)], which could be attributed to a stronger influence of a surface depletion layer formed due to interface state/trapped charges [16][17][18] or presence of a thin intrinsic, or even n-type, shell formed due to oxygen absorption on GaSb. 19 The radius of the conductive core (r C ) in the NWs, assuming a surface Fermi level pinning, can be obtained from the full depletion approximation. From the Gauss law, the surface potential, wðr NW Þ, is obtained as where N a is the doping concentration.…”
mentioning
confidence: 99%