2012
DOI: 10.1134/s1063782612040136
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Charge transport at the interface of n-GaAs (100) with an aqueous HCl solution: Electrochemical impedance spectroscopy study

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Cited by 12 publications
(14 citation statements)
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“…for 2 min to remove arsenic and gallium oxides [19]. Then, substrates are rinsed in deionized water for 2 min to remove Ga-Clx species since they are soluble in water [20]. Finally, substrates are immersed in 1 M HClO4 (supporting electrolyte) for 2 min to remove possible Clions remaining in the solution or adsorbed at the substrate surface.…”
Section: Methodsmentioning
confidence: 99%
See 1 more Smart Citation
“…for 2 min to remove arsenic and gallium oxides [19]. Then, substrates are rinsed in deionized water for 2 min to remove Ga-Clx species since they are soluble in water [20]. Finally, substrates are immersed in 1 M HClO4 (supporting electrolyte) for 2 min to remove possible Clions remaining in the solution or adsorbed at the substrate surface.…”
Section: Methodsmentioning
confidence: 99%
“…EC,s = (-3.737 ± 0.020) eV (20) The uncertainty has been considered as the standard deviation of the average due to the different reported values. In the same way we have calculated the valence band (VB) edge:…”
Section: Energy Band Diagram Of the Seimentioning
confidence: 99%
“…Chemical dissolution of III-V materials is, for the most part, governed by the number of hole carriers drifted into the solid/electrolyte interface [50]. The excess hole carriers generated by photoexcitation of the semiconductor can contribute either to surface state mediated recombination [51], or by participating in the charge transfer reaction with the surrounding electrolyte via surface states [52]. While recombination by means of surface states is non-radiative and independent of the surface band bending [53], the hole-driven photoetching reactions can be changed according to band bending conditions.…”
Section: And Symmetric Stretching Vibration Of Somentioning
confidence: 99%
“…The equivalent electrical circuit of the SEI is formed by several capacitances and resistances: semiconductor capacitance (C sc ), surface states capacitance (C SS ), double layer capacitance (C H ), charge transfer resistance (R t ), etc. 40,43,47 .…”
Section: Analysis Of the Current Density Transientsmentioning
confidence: 99%