2016
DOI: 10.1038/nenergy.2016.150
|View full text |Cite
|
Sign up to set email alerts
|

Charge transport in CdTe solar cells revealed by conductive tomographic atomic force microscopy

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1

Citation Types

7
80
0

Year Published

2017
2017
2023
2023

Publication Types

Select...
6
2

Relationship

1
7

Authors

Journals

citations
Cited by 72 publications
(87 citation statements)
references
References 34 publications
7
80
0
Order By: Relevance
“…Our findings that contain what appears to be planar defects or twin boundaries, consistent with those observed in Ref. [12]. The field of view for all images is 48 μm.…”
Section: Resultssupporting
confidence: 91%
“…Our findings that contain what appears to be planar defects or twin boundaries, consistent with those observed in Ref. [12]. The field of view for all images is 48 μm.…”
Section: Resultssupporting
confidence: 91%
“…Therefore, this minimise the recombination mechanism in these devices and the density of photo-generated currents are high in grain boundaries. This has been clearly demonstrated by recent EBIC results of the cross-sections of CdS/CdTe solar cells [67,68]. In this type of grain boundary enhanced PV actions, only one type of charge carriers flow along the grain boundaries and any defects present will be saturated instantaneously upon illumination and then show high quality electrical conduction.…”
Section: Grain Boundary Enhanced Pv Effectmentioning
confidence: 79%
“…In 2015, Buckwell et al [22] used scalpel AFM to analyze CNFs in W/SiOX/TiN samples; however, the diameter of the CNFs observed was much wider (Ø > 500 nm), which may not correspond to that of real RS devices under normal operation. And in 2016, Luria et al [38] used scalpel AFM to characterize polycrystalline 2.2 µm thick CdTe films for photovoltaic cells, and the granular structure of the CdTe film was successfully displayed, showing conductive grain boundaries wider than 100 nm. However, in these two works [22,38] the features studied had diameters much larger than the CNFs displayed by the IMEC group, and it is a fact that in five years no other group has reported the characterization of the 3D shape and 3D currents of nanosized CNFs (Ø <30 nm) across amorphous thin (<10 nm) oxides using scalpel AFM.…”
Section: Introductionmentioning
confidence: 99%