Charging and discharging of graphene in ambient conditions studied with scanning probe microscopy

Verdaguer, Albert; Cardellach, Mar; Segura, Juan José; Sacha, G. M.; Moser, J.; Zdrojek, Mariusz; Bachtold, Adrian; Fraxedas, Jordi

doi:10.1063/1.3149770

Cited by 63 publications

(58 citation statements)

References 14 publications

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“…One could think of cases where a tip interacts with water layers on a sample's surface and where the volume of water increases with time due to the proximity of the tip and the resulting conne-ment and condensation. Similar fast processes might result from the segregation of matter on the surface on reaching thermodynamic equilibrium, 144 the creeping or plastic deformation occurring on the tip and/or the sample, 145 the motion of ions on the surface, 146 charge transfer 147 or as fast events in biological interactions. 86 An example that shows the probing of transient phenomena is shown in Fig.…”

Section: Transient Phenomena and The Differential Quadrature Methods (mentioning

confidence: 99%

Single cycle and transient force measurements in dynamic atomic force microscopy

Gadelrab¹,

Santos²,

Font

et al. 2013

Nanoscale

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The monitoring of the deflection of a micro-cantilever, as the end of a sharp probe mounted at its end, i.e. the tip, interacts with a surface, forms the foundation of atomic force microscopy AFM. In a nutshell, developments in the field are driven by the requirement of obtaining ever increasing throughput and sensitivity, and enhancing the versatility of the instrument to simultaneously map the topography and quantify nanoscale processes and properties. In the most common dynamic mode of operation, the motion of the driven cantilever is monitored at a single point on its longitudinal axis. Here, we show that from this single point a waveform is obtained that contains all the details about conservative and dissipative interactions. Then a formalism that accounts for multiple arbitrary flexural modes is developed for an indirectly driven cantilever. The formalism is shown to allow recovery of the details of the interaction even in the presence of complex and relevant hysteretic forces when the cantilever oscillates in the steady state. In a different approach, we develop a formalism that monitors the wave profile of the cantilever, i.e. the waveform at five different points on its longitudinal axis. With this formalism the interaction can be reconstructed during a single oscillation cycle even in the transient state of oscillation. Finally, we discuss the potential and advantages of the proposed methods and future technical challenges. Other standard and state of the art techniques and methods are also discussed and compared with the ones presented here. This work should also provide insight into the current high throughput-high sensitivity developments dealing with multifrequency dynamic AFM where information is recovered from multiple eigenmodes.

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Section: Transient Phenomena and The Differential Quadrature Methods (mentioning

confidence: 99%

Single cycle and transient force measurements in dynamic atomic force microscopy

Gadelrab¹,

Santos²,

Font

et al. 2013

Nanoscale

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“…Understanding the electric field effect in nanostructured thin films is a key issue in nanoscience nowadays. 1 By applying a voltage between a force microscope tip and a sample, electrostatic force microscopy (EFM) [2][3][4][5][6][7][8] has been used to analyze different properties of thin films at the nanoscale. 9 Recently, single and few layer graphene (FLG) 10 have attracted much attention because of its atypical response to electrostatic fields, which is in sharp contrast with that expected for conventional conducting or semiconducting films.…”

mentioning

confidence: 99%

Ultrahigh dielectric constant of thin films obtained by electrostatic force microscopy and artificial neural networks

Castellano‐Hernández

Sacha

2012

Applied Physics Letters

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Copyright 2012 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.A detailed analysis of the electrostatic interaction between an electrostatic force microscope tip and a thin film is presented. By using artificial neural networks, an equivalent semiinfinite sample has been described as an excellent approximation to characterize the whole thin film sample. A useful analytical expression has been also developed. In the case of very small thin film thicknesses (around 1 nm), the electric response of the material differs even for very high dielectric constants. This effect can be very important for thin materials where the finite size effect can be described by an ultrahigh thin filmdielectric constant.This work was supported by TIN2010-196079. G.M.S. acknowledges support from the Spanish Ramón y Cajal Program

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“…Figure 1f presents the KPFM image of exactly the same area as that in Fig. 1d and 1e but taken after 14 h. The image contrast is greatly reduced, indicating the decay of DSP due to the diminishment of the surface screening charges 13,17,18 .…”

Section: Resultsmentioning

confidence: 88%

A new non-destructive readout by using photo-recovered surface potential contrast

Yang¹

2015

J Material Sci Eng

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Ferroelectric random access memory is still challenging in the feature of combination of room temperature stability, non-destructive readout and high intensity storage. As a non-contact and non-destructive information readout method, surface potential has never been paid enough attention because of the unavoidable decay of the surface potential contrast between oppositely polarized domains. That is mainly due to the recombination of the surface movable charges around the domain walls. Here, by introducing a laser beam into the combination of piezoresponse force microscopy and Kelvin probe force microscopy, we demonstrate that the surface potential contrast of BiFeO 3 films can be recovered under light illumination. The recovering mechanism is understood based on the redistribution of the photo-induced charges driven by the internal electric field. Furthermore, we have created a 12-cell memory pattern based on BiFeO 3 films to show the feasibility of such photo-assisted non-volatile and non-destructive readout of the ferroelectric memory.F erroelectric materials are promising candidates for ferroelectric random access memories (FeRAMs) using their spontaneous polarization 1 , which can be switched by an external electrical field. Although FeRAMs are non-volatile and the reading/writing process can be completed within nanoseconds 2,3 , one fatal problem for conventional FeRAMs is that the reading process, which is performed by applying a bias to the ferroelectric capacitor and detecting the polarization switching current, is destructive because a rewriting process is needed. Thus, it is highly desirable to have a non-destructive readout method [4][5][6] . Polarization reversal influences the surface potential (SP) 7 which mirrors the surface charges in the polarized regions. A clear understanding of the behavior of surface charges after poling is crucial to utilizing ferroelectricity at the nanometer scale. Despite much of the work on the study of the SP of the ferroelectric materials [8][9][10][11][12] , relatively little emphasis has been placed on the readout method by measuring the non-contact SP in a ferroelectric memory, simply because the SP contrast (DSP) between oppositely polarized domains decays and fails to be kept as a memory, which is mainly due to the evolution and recombination of the movable surface charges 7,8,11,13 around the domain walls. So far, the room-temperature stability of DSP has not been succeeded, so the high density memory based on this concept faces critical challenge.By introducing a laser beam with an optical fiber into a system for piezoresponse force microscopy (PFM) and Kelvin probe force microscopy (KPFM), we demonstrate conceptually the decay issue of DSP between the oppositely polarized domains can be resolved by photo-assisted recovery. Under the sustained internal polarization field, photo-induced charges recover DSP, thus reproducing the memory readout signal in a non-destructive and non-volatile manner. Our theoretical calculations reproduce our experimental results, rev...

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Charging and discharging of graphene in ambient conditions studied with scanning probe microscopy

Abstract: Photochemical reaction of organosilane self-assembled monolayer as studied by scanning probe microscopy

Cited by 63 publications

References 14 publications

Single cycle and transient force measurements in dynamic atomic force microscopy

Single cycle and transient force measurements in dynamic atomic force microscopy

Ultrahigh dielectric constant of thin films obtained by electrostatic force microscopy and artificial neural networks

A new non-destructive readout by using photo-recovered surface potential contrast

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