Chemical Analysis of Inorganic and Organic Surfaces and Thin Films by Static Time‐of‐Flight Secondary Ion Mass Spectrometry (TOF‐SIMS)

Benninghoven, A.

doi:10.1002/anie.199410231

Cited by 480 publications

(312 citation statements)

References 38 publications

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“…In ToF-SIMS, a pulsed, focused, energetic ion beam bombards a surface, leading to interactions that cause the emission of positive and negative secondary ions [33,34]. The instrument used was a reflectron type time-of-flight mass spectrometer, with a design equivalent to that of the 'ToF-SIMS IV'.…”

Section: Time Of Flight Secondary Ion Mass Spectrometry (Tof-sims)mentioning

confidence: 99%

Flame treatment of low-density polyethylene: Surface chemistry across the length scales

Song¹,

Gunst

Arlinghaus

et al. 2007

Applied Surface Science

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The relationship between surface chemistry and morphology of flame treated low-density polyethylene (LDPE) was studied by various characterization techniques across different length scales. The chemical composition of the surface was determined on the micrometer scale by Xray photoelectron spectroscopy (XPS) as well as with time of flight secondary ion mass spectrometry (ToF-SIMS), while surface wettability was obtained through contact angle (CA) measurements on the millimeter scale. The surface concentration of hydroxyl, carbonyl and carboxyl groups, as a function of the ''number'' of the flame treatment passes (which is proportional to the treatment time) was obtained. Moreover, a correlation was found with chemical composition and polarity, emphasizing the role of oxygen-containing functional groups introduced during the treatment. Carboxyl functional groups were specifically identified by fluorescent labeling and the results were compared with the ToF-SIMS data. In addition, atomic force microscopy (AFM) was used to evaluate changes in surface topography and roughness on the nanometer to micrometer length scales. After flame treatment, water-soluble low molecular weight oxidized materials (LMWOM), which were generated as products of oxidation and chain scission of the LDPE surface, agglomerated into small topographical mounds that were visible in the AFM micrographs. After rinsing the flame treated samples with water and ethanol, bead-like nodular surface structures were observed. The ionization state of flame treated LDPE surfaces was monitored by chemical force microscopy (CFM). The effective surface pK a values of carboxylic acid (-COOH) obtained by AFM were revealed by chemical force titration curves and the effective surface pK a values were found to be around 6. #

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Section: Time Of Flight Secondary Ion Mass Spectrometry (Tof-sims)mentioning

confidence: 99%

Flame treatment of low-density polyethylene: Surface chemistry across the length scales

Song¹,

Gunst

Arlinghaus

et al. 2007

Applied Surface Science

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“…ToF-SIMS (Time-of-Flight Secondary Ion Mass Spectrometry) analysis is a very powerful technique to assess the composition of a given material 36 by controlled sputtering. The capability to detect tiny traces of chemical species within small areas (less than 0.01 mm 2 ), and with a depth resolution that approaches the nm, makes it a particularly suitable tool for the investigation of nmthick layers, such as our SFS heterostructures, in the search for anomalies at the interfaces between layers, 37 or for contaminants between and inside the layers.…”

Section: Tof-simsmentioning

confidence: 99%

Robustness of the0−πtransition against compositional and structural ageing in superconductor/ferromagnetic/superconductor heterostructures

et al. 2015

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We have studied the temperature induced 0 − π thermodynamic transition in Nb/PdNi/Nb Superconductor/Ferromagnetic/Superconductor (SFS) heterostructures by microwave measurements of the superfluid density. We have observed a shift in the transition temperature with the ageing of the heterostructures, suggesting that structural and/or chemical changes took place. Motivated by the electrodynamics findings, we have extensively studied the local structural properties of the samples by means of X-ray Absorption Spectroscopy (XAS) technique, and the compositional profile by Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS). We found that the samples have indeed changed their properties, in particular for what concerns the interfaces and the composition of the ferromagnetic alloy layer. The structural and compositional data are consistent with the shift of the 0 − π transition toward the behaviour of heterostructures with different F layers. An important emerging indication to the physics of SFS is the weak relevance of the ideality of the interfaces: even in aged samples, with less-than-ideal interfaces, the temperature-induced 0 − π transition is still detectable albeit at a different critical F thickness.

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“…To overcome this difficulty, TOF spectrometers have been widely used [72,73]. Imaging MS has the unique ability to acquire the spatial distribution of a wide range of atoms, isotopes and molecules and, for many years, commercially available TOF-SIMS instruments have been able to produce mass resolution of several thousand in imaging mode [74,75].…”

Section: Secondary Ion Mass Spectrometry and Sputtered Neutral Mass Smentioning

confidence: 99%

Inorganic mass spectrometry as a tool for characterisation at the nanoscale

et al. 2009

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Inorganic mass spectrometry techniques may offer great potential for the characterisation at the nanoscale, because they provide unique elemental information of great value for a better understanding of processes occurring at nanometre-length dimensions. Two main groups of techniques are reviewed: those allowing direct solid analysis with spatial resolution capabilities, i.e. lateral (imaging) and/or indepth profile, and those for the analysis of liquids containing colloids. In this context, the present capabilities of widespread elemental mass spectrometry techniques such as laser ablation coupled with inductively coupled plasma mass spectrometry (ICP-MS), glow discharge mass spectrometry and secondary ion/neutral mass spectrometry are described and compared through selected examples from various scientific fields. On the other hand, approaches for the characterisation (i.e. size, composition, presence of impurities, etc.) of colloidal solutions containing nanoparticles by the well-established ICP-MS technique are described. In this latter case, the capabilities derived from the on-line coupling of separation techniques such as field-flow fractionation and liquid chromatography with ICP-MS are also assessed. Finally, appealing trends using ICP-MS for bioassays with biomolecules labelled with nanoparticles are delineated.

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Chemical Analysis of Inorganic and Organic Surfaces and Thin Films by Static Time‐of‐Flight Secondary Ion Mass Spectrometry (TOF‐SIMS)

Cited by 480 publications

References 38 publications

Flame treatment of low-density polyethylene: Surface chemistry across the length scales

Flame treatment of low-density polyethylene: Surface chemistry across the length scales

Robustness of the0−πtransition against compositional and structural ageing in superconductor/ferromagnetic/superconductor heterostructures

Inorganic mass spectrometry as a tool for characterisation at the nanoscale

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