2003
DOI: 10.1016/s0301-679x(02)00202-5
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Chemical analysis of wear tracks on magnetic disks by TOF-SIMS

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Cited by 23 publications
(10 citation statements)
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“…It also has excellent mass resolution for a wide variety of chemical species, including hydrogen and carbon, which make up the bulk of these NFC films. TOF-SIMS has already been used by researchers to determine the failure mechanisms of carbon overcoats and thin lubricant films used on magnetic storage media [12,13]. Fukui et al [14] used TOF-SIMS to determine the chemistry of transfer layers in relation to the friction and wear behavior of a hydrogenated DLC film after tests in ambient air [14].…”
Section: Introductionmentioning
confidence: 99%
“…It also has excellent mass resolution for a wide variety of chemical species, including hydrogen and carbon, which make up the bulk of these NFC films. TOF-SIMS has already been used by researchers to determine the failure mechanisms of carbon overcoats and thin lubricant films used on magnetic storage media [12,13]. Fukui et al [14] used TOF-SIMS to determine the chemistry of transfer layers in relation to the friction and wear behavior of a hydrogenated DLC film after tests in ambient air [14].…”
Section: Introductionmentioning
confidence: 99%
“…Recently, time-of-flight secondary ion mass spectroscopy (TOF-SIMS) was introduced as a sophisticated surface analysis technique for tribological surfaces [15][16][17][18][19][20][21][22][23]. The outline of the analysis is based on mass spectrum of compounds which exist on the surfaces.…”
Section: Introductionmentioning
confidence: 99%
“…In this study, the DLC coatings were deposited with filtered cathodic vacuum arc (FCVA) system with chromium interlayer. The FCVA technique produces high quality coatings and argon plasma generated by FCVA was used for substrate etching . The present work deals with the microstructure, tribology and adhesion strength of DLC coatings deposited on argon pretreated stainless steel and WC‐Co substrates.…”
Section: Introductionmentioning
confidence: 99%