Chemical and magnetic profile of magnetic semiconductors as probed by polarized neutron reflectivity

Abstract

We investigate the depth dependency of magnetic species in co-doped dilute magnetic semiconductor (DMS) specimens. We also compare the reliability in nuclear and magnetization depth profile of these specimens at different polarized neutron reflectivity (PNR) instruments. These reflectometers were not only angle dispersive but also wavelength dispersive instrument. Measurements, indicate a segregation of DMS species on to the top into the cap-layer for lower Fe-doping.However, for higher Fe-doping, as we alter the doping concentrations of magnetic species, it indicates no segregation and lower clustering tendencies. Thus sensitive depth-profiling, for specimens with such low magnetic-ion concentrations, may not be a challenge for brighter sources and careful measurements. Our results shows that the homogeneity can be achieved with Fe co-doping within the Ge matrix which can make it a potential candidate for spintronic applications.

Tuning spinterface properties in iron/fullerene thin films

“…The relation between Q Z and the incidence/reflected angle is Q Z = 4π λ sinθ where θ is the angle of incidence/reflection and λ is the neutron wavelength. It is possible to acquire layer specific magnetic information of a multilayer sample by selecting a suitable scan range of Q Z as it is a variable conjugate to the depth d from the surface of the film [27]. (Figure 2(a)).…”

“…λ sinθ where θ is the angle of incidence/reflection and λ is the neutron wavelength. It is possible to acquire layer specific magnetic information of a multilayer sample by selecting a suitable scan range of Q Z as it is a variable conjugate to the depth d from the surface of the film [27]. Therefore, a loss of ∼21% of magnetic moment is observed for sample 1 with respect to its reference sample 1A.…”