Chemical and magnetization profile study of Ce in [CeLaCe/Fe] and [LaCeLa/Fe] multilayers by resonant X-ray reflectivity

Jaouen, N.; Tonnerre, J. M.; Bontempi, Elza; Raoux, D.; Sève, L.; Bartolomé, Fernando; Рогалев, А.; Muenzenberg, Markus; Felsch, W.; Dürr, H. A.; Dudzik, E.; Maruyama, Hiroshi

doi:10.1016/s0921-4526(99)01928-6

Cited by 11 publications

(5 citation statements)

References 21 publications

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“…As most readers are more familiar with Bragg peaks, this approach seems to be more intuitive. Superlattice reflections in multilayers contain information of layer-averaged properties, for example magnetization depth profiles for one component of the whole multilayer system [19,20,121]. Figure 9 shows the experimental NM resonant reflectivity curves of a Ce/Fe multilayer system reproduced from [19] in combination with the simulated reflectance for a multilayer system.…”

Section: Hard X-ray Reflectivity For Multilayer Systems: Cefementioning

confidence: 99%

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Magnetic reflectometry of heterostructures

Macke

Goering

2014

J. Phys.: Condens. Matter

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Measuring the magnetic configuration at complex buried layers and interfaces is an important task, which requires especially a non-destructive probing technique. X-ray resonant magnetic reflectometry (XRMR) combines the non-destructive depth profiling potential of x-ray reflectometry with the excellent sensitivity for magnetic phenomena, utilizing the x-ray magnetic circular dichroism effect. It provides the magnetic spatial distribution with a precision down to the angstrom scale, combined with element and symmetry specificity, sub-monolayer sensitivity, and the possible separation of spin and orbital magnetic moments. This review provides an overview to the XRMR technique in a tutorial way. We focus on the introduction to the theory, measurement types, and data simulation. We provide related experimental examples and show selected applications.

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Section: Hard X-ray Reflectivity For Multilayer Systems: Cefementioning

confidence: 99%

Section: Hard X-ray Reflectivity For Multilayer Systems: Cefementioning

confidence: 99%

Magnetic reflectometry of heterostructures

Macke

Goering

2014

J. Phys.: Condens. Matter

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“…9,10 Superlattice reflections in multilayers contain information of layer-averaged properties, for, e.g., magnetization depth profiles, of one component of the whole multilayer system. [11][12][13] Thus lateral variations and their dependence of the distance of an individual layer from the substrate, important for components with large lattice mismatch, can hardly be addressed. Furthermore, diffuse XRMS in the soft x-ray region can be applied to investigate correlations between chemical and magnetic roughness in thin films and multilayers.…”

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confidence: 99%

Pt magnetization profile in a Pt/Co bilayer studied by resonant magnetic x-ray reflectometry

et al. 2001

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The Pt magnetization depth profile at a single buried Pt/Co interface was investigated by x-ray resonant magnetic reflectivity measurements. The asymmetry as function of angle of incidence has been measured in the Pt L 3 -near-edge absorption region at two energies. Observed asymmetry ratios in the order of 0.5% are described on the basis of a magnetically modified Parratt algorithm. Excellent agreement between simulations and experiment was achieved for a Pt magnetic moment of 0.21 B at the rough interface followed by an exponential decay of the induced polarization within 1 nm.

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“…The study of the magnetization profile relies on the refinement of R, derived from angle-dependent reflectivity, which requires the determination of the structural parameters of the heterostructure. In order to allow a more unequivocal analysis of the X-ray reflectivity [15], the data are collected at various incident photon energies 670 eV and 760 eV, far from both the Fe L 3 (706.8 eV) and Co L 3 (778.1 eV) edges and at a few energies close to the edges. Figure 2 shows the non-magnetic intensities I ave = (I p +I m )/2 and the fitting curves as a function of the scattering vector q for energies close to the Fe L 3 edge.…”

Section: Resultsmentioning

confidence: 99%

Depth-resolved magnetization profile of MgO/CoFeB/W perpendicular half magnetic tunnel junctions

et al. 2022

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In this work, we used the soft X-ray resonant magnetic reflectivity to study the depth-resolved out-of-plane ( oop) magnetization profile of a CoFeB/MgO sample with W/Ta cap layer after annealing at 400°C. It is a powerful technique to probe buried magnetic interfaces of ultra-thin films by combining the depth-resolved information of X-ray reflectivity with the species selectivity of X-ray magnetic circular dichroism. It allowed us to resolve the oop magnetization within a 1.36 nm thick CoFeB layer by the measurement of angle-dependent specular reflectivity at large scattering angles (up to 80°). We determined a graded magnetic distribution for both Fe and Co with a 20% increase at the interface with MgO, decreasing slightly over a thickness of 0.7 nm from MgO before it rapidly decreases to 50% at the interface with W. After applying a non-saturating magnetic field in the plane of the sample, we also quantified a similar magnetization profile with an inclined moment configuration. This indicates that the magnetization gradient is a robust property of the CoFeB layer in the studied sample.

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Chemical and magnetization profile study of Ce in [CeLaCe/Fe] and [LaCeLa/Fe] multilayers by resonant X-ray reflectivity

Cited by 11 publications

References 21 publications

Magnetic reflectometry of heterostructures

Magnetic reflectometry of heterostructures

Pt magnetization profile in a Pt/Co bilayer studied by resonant magnetic x-ray reflectometry

Depth-resolved magnetization profile of MgO/CoFeB/W perpendicular half magnetic tunnel junctions

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