2006
DOI: 10.1016/j.tsf.2005.07.166
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Chemical bonding investigation of amorphous hydrogenated Si–N alloys deposited by plasma immersion ion processing

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Cited by 3 publications
(1 citation statement)
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“…6B) Sisamples show the most important peak at about 101.8 eV. This binding energy is very close to one obtained for Si 3 N 4 , of about 101.9 eV [14]. The peak is more intense for the de-hydrogenated sample compared to the re-hydrogenated one, in good agreement with the XRD data.…”
Section: Tablesupporting
confidence: 87%
“…6B) Sisamples show the most important peak at about 101.8 eV. This binding energy is very close to one obtained for Si 3 N 4 , of about 101.9 eV [14]. The peak is more intense for the de-hydrogenated sample compared to the re-hydrogenated one, in good agreement with the XRD data.…”
Section: Tablesupporting
confidence: 87%