2022
DOI: 10.1016/j.nima.2022.166365
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Chemical conversions in lead thin films induced by heavy-ion beams at Coulomb barrier energies

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Cited by 6 publications
(6 citation statements)
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“…Since the establishment of molecular plating by Parker and Falk [1] 60 years ago, knowledge about the method has been gained via many different methods. Via different microscopic methods, like RI, SEM and AFM, and different spectroscopic methods, like alpha and gamma spectroscopy, EDS, XPS, XRD, RBS, IR, and Raman spectroscopy [2,4,7,[13][14][15][16][17]19,27], a more precise understanding of the process of MP and of the chemical composition of the thin films was obtained. It became clear that no nitrates or chlorides are deposited, but that the thin film consisted mainly of oxides and hydroxides.…”
Section: Discussionmentioning
confidence: 99%
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“…Since the establishment of molecular plating by Parker and Falk [1] 60 years ago, knowledge about the method has been gained via many different methods. Via different microscopic methods, like RI, SEM and AFM, and different spectroscopic methods, like alpha and gamma spectroscopy, EDS, XPS, XRD, RBS, IR, and Raman spectroscopy [2,4,7,[13][14][15][16][17]19,27], a more precise understanding of the process of MP and of the chemical composition of the thin films was obtained. It became clear that no nitrates or chlorides are deposited, but that the thin film consisted mainly of oxides and hydroxides.…”
Section: Discussionmentioning
confidence: 99%
“…[13,15,19,26]. However, these methods are all unable to provide information on the chemical composition of the thin films, which is why spectroscopic methods, like IR, Raman, X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), or ion beam spectroscopy like elastic recoil detection analysis (ERDA), Rutherford backscattering (RBS) or proton-induced X-ray emission (PIXE), were also used later [2,13,15,16,19,[27][28][29].…”
Section: Methodsmentioning
confidence: 99%
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