Nanocrystalline cadmium sulfide (CdS) thin films were prepared using chemical bath deposition in a solution bath containing CdSO 4 , SC(NH 2 ) 2 , and NH 4 OH. The CdS thin films were investigated using X-ray diffraction (XRD), photoluminescence (PL), and Fourier transform infrared spectroscopy (FTIR). The as-deposited CdS thin film prepared at 80°C for 60 min had a cubic phase with homogeneous and small grains. In the PL spectrum of the 2,900 Å-thick CdS thin film, the broad red band around 1.7 eV and the broad high-energy band around 2.7 eV are attributed to the S vacancy and the band-to-band transition, respectively. As the deposition time increases to over 90 min, the PL intensity from the band-to-band transition significantly increases. The temperature dependence of the PL intensity for the CdS thin films was studied from 16 to 300 K. The E A and E B activation energies are obtained by fitting the temperature dependence of the PL intensity. The E A and E B are caused by the deep trap and shallow surface traps, respectively. From the FTIR analysis of the CdS thin films, a broad absorption band of the OH stretching vibration in the range 3,000-3,600 cm -1 and the peak of the CN stretching vibration at 2,000 cm -1 were found.