“…There is a complex task for which a combination of different methods is required. The results of the classical methods for the composition analysis, e.g., iodometry, cerimetry or electroanalysis methods, should be correlated with the crystallographic structure and microstructure information coming from application of X-ray diffraction techniques, neutron diffraction, high-resolution electron microscopy (HRTEM), laser Raman spectroscopy (LRS) and electron paramagnetic resonance (EPR), together other advanced technique imaging at the atomic level and allowing a detailed study of local defect structures and chemistry, e.g., scanning transmission electron microscopy (STEM) and in situ electron energy loss spectroscopy (EELS) [47][48][49][50][51][52]. In addition, many advances have come by measuring the physical properties such as electrical conductivity, magnetic, optical, and optoelectronic properties that strongly depend on stoichiometry and on types and concentration of the defects.…”