“…The energy of the emitted x-ray radiation is characteristics for the emitting element, its intensity is related to the concentration of the element in the irradiated sample. 2,3 EDXRF technique has a number of advantages, such as capability for quantitative multi elemental and simultaneous analysis of all elements with atomic number Z > 10, relatively simple measurement setup, minimal or no need at all for sample preparation, and in the case of thin sample deposits straightforward calibration methodology. As every analytical technique EDXRF has also weak points which include rather moderate detection capability, especially at the low-Z side of its analytical range, presence of interelement interfering effects, need for correcting matrix effects for samples where x-ray absorption phenomena cannot be neglected, lack of capability for detecting such elements as H, C, N which constitute majority of mass for samples with organic matrix.…”