Chemical etching and surface oxidation studies of cadmium zinc telluride radiation detectors

Özsan, M.E.; Sellin, P.J.; Veeramani, P.; Hinder, Steven J.; Monnier, M.; Prekas, G.; Lohstroh, A.; Baker, Mark

doi:10.1002/sia.3146

Cited by 20 publications

(11 citation statements)

References 14 publications

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Section: Introductionmentioning

confidence: 93%

“…time, but the different attenuation lengths, λ, are probably the major cause of discrepancy. Özsan et al [8] used the simpler, empirical Seah and Dench [17] approach, which yields a value of 2.6 nm for λ, rather than the more refined Cumpson and Seah expression [16] employed in this work, which gives a value of 1.5 nm.…”

Section: (Ii) the Beer-lambert Expression Employing Multiple Photoelementioning

confidence: 99%

“…Most commonly, bromine in methanol (BM) of varying concentrations is used. Özsan et al found that the Cd/Te ratio at the surface was invariant after a 2 minute exposure in 0.2 and 1.0 % BM solution, but the graded Te layer increased in thickness as the BM concentration was increased [8]. However, the enriched Te layer thickness was not quantified.…”

Section: Introductionmentioning

confidence: 99%

“…% H 2 O 2 produces an oxide thickness which is dependent on BM concentration up to a BM concentration of 2 % [8]. The oxide thickness dependence on exposure time of passivating agent was only measured for a 0.2 %, BM concentration, but was found to be similar, for all exposure times [8]. Considering a number of authors' work, the thickness of the H 2 O 2 generated oxide is in the range of 1.6 -4.5 nm, depending on the BM concentration and oxide thickness calculation method employed [8,11,[12].…”

Section: Introductionmentioning

confidence: 99%

See 3 more Smart Citations

An XPS study of bromine in methanol etching and hydrogen peroxide passivation treatments for cadmium zinc telluride radiation detectors

Babar

Sellin

Watts

et al. 2013

Applied Surface Science

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Section: Introductionmentioning

confidence: 93%

Section: (Ii) the Beer-lambert Expression Employing Multiple Photoelementioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

See 2 more Smart Citations

An XPS study of bromine in methanol etching and hydrogen peroxide passivation treatments for cadmium zinc telluride radiation detectors

Babar

Sellin

Watts

et al. 2013

Applied Surface Science

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“…This way we confirmed a formation of a TeO 2 surface layer after keeping the sample three weeks on ambient air at room temperature. The thickness of the oxide layer can be evaluated as described in [17]. After chemical etching, no oxide is detected by XPS.…”

Section: Resultsmentioning

confidence: 99%

Dynamics of native oxide growth on CdTe and CdZnTe X-ray and gamma-ray detectors

Zázvorka

Franc

Beran

et al. 2016

Science and Technology of Advanced Materials

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We studied the growth of the surface oxide layer on four different CdTe and CdZnTe X-ray and gamma-ray detector-grade samples using spectroscopic ellipsometry. We observed gradual oxidization of CdTe and CdZnTe after chemical etching in bromine solutions. From X-ray photoelectron spectroscopy measurements, we found that the oxide consists only of oxygen bound to tellurium. We applied a refined theoretical model of the surface layer to evaluate the spectroscopic ellipsometry measurements. In this way we studied the dynamics and growth rate of the oxide layer within a month after chemical etching of the samples. We observed two phases in the evolution of the oxide layer on all studied samples. A rapid growth was visible within five days after the chemical treatment followed by semi-saturation and a decrease in the growth rate after the first week. After one month all the samples showed an oxide layer about 3 nm thick. The oxide thickness was correlated with leakage current degradation with time after surface preparation.

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Surface and interface chemistry of bromine–methanol‐etched Cd_0.9Zn_0.1Te crystals

Ünal,

Karaman,

Çelik

et al. 2024

Surface & Interface Analysis

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Chemical polishing or chemo‐mechanical polishing is crucial as a last step of surface preparation to remove the damaged layer and contaminants from the surface of CdZnTe crystals. The bromine–methanol solution is widely used for this purpose. However, bromine–methanol solution enriches the surface with Te and results in poor performance of CdZnTe crystals. In this study, the effect of the chemical polishing with 5% bromine–methanol solution on the surface and at the interface is investigated and it is demonstrated that etching duration strongly influences surface stoichiometry and interface contaminants. The evolution of the surface topography with etching and chemical changes are presented. It is shown that after 90 s etching/polishing, subsurface damage is removed and Te enrichment is minimum. Moreover, interface layer thickness is the smallest for 90 s etching duration. It is presented that further increase in the etching duration disturbs the surface stoichiometry and interface depth. It also calculated that 90 s of etching shows low interface barrier and symmetrical current–voltage curve.

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Chemical etching and surface oxidation studies of cadmium zinc telluride radiation detectors

Abstract: Abstract:CdZnTe (CZT) is commonly used as a radiation detector material and the surface properties are important as they influence detector performance. The surface chemistry is generally controlled through chemical etching and oxidation processes.

Cited by 20 publications

References 14 publications

An XPS study of bromine in methanol etching and hydrogen peroxide passivation treatments for cadmium zinc telluride radiation detectors

An XPS study of bromine in methanol etching and hydrogen peroxide passivation treatments for cadmium zinc telluride radiation detectors

Dynamics of native oxide growth on CdTe and CdZnTe X-ray and gamma-ray detectors

Surface and interface chemistry of bromine–methanol‐etched Cd_0.9Zn_0.1Te crystals

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Chemical etching and surface oxidation studies of cadmium zinc telluride radiation detectors

Abstract: Abstract:CdZnTe (CZT) is commonly used as a radiation detector material and the surface properties are important as they influence detector performance. The surface chemistry is generally controlled through chemical etching and oxidation processes.

Cited by 20 publications

References 14 publications

An XPS study of bromine in methanol etching and hydrogen peroxide passivation treatments for cadmium zinc telluride radiation detectors

An XPS study of bromine in methanol etching and hydrogen peroxide passivation treatments for cadmium zinc telluride radiation detectors

Dynamics of native oxide growth on CdTe and CdZnTe X-ray and gamma-ray detectors

Surface and interface chemistry of bromine–methanol‐etched Cd0.9Zn0.1Te crystals

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Product

Resources

About

Surface and interface chemistry of bromine–methanol‐etched Cd_0.9Zn_0.1Te crystals